Details
| Original language | English |
|---|---|
| Pages (from-to) | B231-B238 |
| Journal | Applied optics |
| Volume | 62 |
| Issue number | 7 |
| Publication status | Published - 1 Mar 2023 |
Abstract
The 2022 Optical Interference Measurement Problem comprised the determination of the refractive index of a thin tantalum pentoxide film at a wavelength of 532 nm and the characterization of the UV band edge as an optional task.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Atomic and Molecular Physics, and Optics
- Engineering(all)
- Engineering (miscellaneous)
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
In: Applied optics, Vol. 62, No. 7, 01.03.2023, p. B231-B238.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Optical interference coatings
T2 - measurement problem 2022 [Invited]
AU - Trost, Marcus
AU - Schröder, Sven
AU - Carstens, Florian
AU - Ristau, Detlev
PY - 2023/3/1
Y1 - 2023/3/1
N2 - The 2022 Optical Interference Measurement Problem comprised the determination of the refractive index of a thin tantalum pentoxide film at a wavelength of 532 nm and the characterization of the UV band edge as an optional task.
AB - The 2022 Optical Interference Measurement Problem comprised the determination of the refractive index of a thin tantalum pentoxide film at a wavelength of 532 nm and the characterization of the UV band edge as an optional task.
UR - http://www.scopus.com/inward/record.url?scp=85149130218&partnerID=8YFLogxK
U2 - 10.1364/AO.480479
DO - 10.1364/AO.480479
M3 - Article
AN - SCOPUS:85149130218
VL - 62
SP - B231-B238
JO - Applied optics
JF - Applied optics
SN - 1559-128X
IS - 7
ER -