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| Original language | German |
|---|---|
| Publication status | Published - 2018 |
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Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications. / Werle, Peter; Saadati, Hassan; Seifert, J. M.
2018.
2018.
Research output: Contribution to conference › Paper › Research
Werle, P., Saadati, H., & Seifert, J. M. (2018). Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications.
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@conference{676ae74bf99c4ee2bae7b3acecf68c88,
title = "Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications",
author = "Peter Werle and Hassan Saadati and Seifert, {J. M.}",
year = "2018",
language = "Deutsch",
}
Download
TY - CONF
T1 - Optical digital microscopy and frequency domain analysis as a quality control of solid composite dielectrics in high voltage applications
AU - Werle, Peter
AU - Saadati, Hassan
AU - Seifert, J. M.
PY - 2018
Y1 - 2018
M3 - Paper
ER -