On-line semiconductor switching loss measurement system for an advanced condition monitoring concept

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Tobias Krone
  • Lan Dang Hung
  • Marco Jung
  • Axel Mertens

External Research Organisations

  • Fraunhofer Institute for Wind Energy Systems (IWES)
View graph of relations

Details

Original languageEnglish
Title of host publication2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (electronic)9789075815245
Publication statusPublished - 25 Oct 2016
Event18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe - Karlsruhe, Germany
Duration: 5 Sept 20169 Sept 2016

Publication series

Name2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe

Abstract

In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.

Keywords

    Current sensor, Diagnostics, IGBT, Reliability, Switching losses, Wind energy

ASJC Scopus subject areas

Cite this

On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. / Krone, Tobias; Hung, Lan Dang; Jung, Marco et al.
2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe. Institute of Electrical and Electronics Engineers Inc., 2016. 7695546 (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Krone, T, Hung, LD, Jung, M & Mertens, A 2016, On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. in 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe., 7695546, 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe, Institute of Electrical and Electronics Engineers Inc., 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe, Karlsruhe, Germany, 5 Sept 2016. https://doi.org/10.1109/EPE.2016.7695546
Krone, T., Hung, L. D., Jung, M., & Mertens, A. (2016). On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. In 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe Article 7695546 (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPE.2016.7695546
Krone T, Hung LD, Jung M, Mertens A. On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. In 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe. Institute of Electrical and Electronics Engineers Inc. 2016. 7695546. (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe). doi: 10.1109/EPE.2016.7695546
Krone, Tobias ; Hung, Lan Dang ; Jung, Marco et al. / On-line semiconductor switching loss measurement system for an advanced condition monitoring concept. 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe. Institute of Electrical and Electronics Engineers Inc., 2016. (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe).
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@inproceedings{f35e05845f854eb1be4fa1f061225b96,
title = "On-line semiconductor switching loss measurement system for an advanced condition monitoring concept",
abstract = "In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.",
keywords = "Current sensor, Diagnostics, IGBT, Reliability, Switching losses, Wind energy",
author = "Tobias Krone and Hung, {Lan Dang} and Marco Jung and Axel Mertens",
note = "Funding Information: The authors would like to thank the German Federal Ministry for Economic Affairs and Energy (BMWi) and the Project Management Julich (PTJ) for funding and managing the joint research project HiReS - Hochzuverlassige Leistungshalbleiter fur Stromrichter in Windenergieanlagen (FKZ: 0325261B) which is the basis of this paper ; 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe ; Conference date: 05-09-2016 Through 09-09-2016",
year = "2016",
month = oct,
day = "25",
doi = "10.1109/EPE.2016.7695546",
language = "English",
series = "2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe",
address = "United States",

}

Download

TY - GEN

T1 - On-line semiconductor switching loss measurement system for an advanced condition monitoring concept

AU - Krone, Tobias

AU - Hung, Lan Dang

AU - Jung, Marco

AU - Mertens, Axel

N1 - Funding Information: The authors would like to thank the German Federal Ministry for Economic Affairs and Energy (BMWi) and the Project Management Julich (PTJ) for funding and managing the joint research project HiReS - Hochzuverlassige Leistungshalbleiter fur Stromrichter in Windenergieanlagen (FKZ: 0325261B) which is the basis of this paper

PY - 2016/10/25

Y1 - 2016/10/25

N2 - In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.

AB - In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.

KW - Current sensor

KW - Diagnostics

KW - IGBT

KW - Reliability

KW - Switching losses

KW - Wind energy

UR - http://www.scopus.com/inward/record.url?scp=84996910381&partnerID=8YFLogxK

U2 - 10.1109/EPE.2016.7695546

DO - 10.1109/EPE.2016.7695546

M3 - Conference contribution

AN - SCOPUS:84996910381

T3 - 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe

BT - 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe

Y2 - 5 September 2016 through 9 September 2016

ER -