On the unique evaluation of local lattice parameters by convergent-beam electron diffraction

Research output: Contribution to journalArticleResearchpeer review

Authors

External Research Organisations

  • University of Siegen
  • National Institute of Standards and Technology (NIST)
  • Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU Erlangen-Nürnberg)
  • University of Cambridge
View graph of relations

Details

Original languageEnglish
Pages (from-to)23-43
Number of pages21
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume74
Issue number1
Publication statusPublished - Jul 1996
Externally publishedYes

Abstract

We summarize some practical aspects of using convergent-beam electron diffraction (CBED) patterns for determination of three-dimensional lattice parameters in crystalline materials. Owing to the insensitivities of certain lattice spacings to changes in lattice parameters, and to measurement errors imposed by finite higher-order Laue zone (HOLZ) linewidths, most CBED patterns can be simulated by a number of different lattice parameter combinations. Unique combinations are found by fitting several patterns obtained from the same area. In cases where a unique set of all six parameters cannot be found, semiquantitative information about elastic stress and strain states can still be extracted. The number of obtainable lattice parameters is affected by the symmetry of the pattern and by the specific HOLZ reflections which are present, for a given accelerating voltage. Symmetry-breaking distortions in patterns from nominally orthorhombic systems can often be attributed to deviations in lattice angles as small as 0 01-0 02° away from 90°, even if such angular distortions are not expected from knowledge of the material’s bulk behaviour. The correct simulation of CBED patterns further requires consideration of foil thinning artefacts on HOLZ line positions. We show that an intelligent choice of zone axis can provide useful information even from difficult sample geometries.

ASJC Scopus subject areas

Cite this

On the unique evaluation of local lattice parameters by convergent-beam electron diffraction. / Maier, H. J.; Keller, R. R.; Renner, H. et al.
In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, Vol. 74, No. 1, 07.1996, p. 23-43.

Research output: Contribution to journalArticleResearchpeer review

Maier, HJ, Keller, RR, Renner, H, Mughrabi, H & Preston, A 1996, 'On the unique evaluation of local lattice parameters by convergent-beam electron diffraction', Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, vol. 74, no. 1, pp. 23-43. https://doi.org/10.1080/01418619608239688
Maier, H. J., Keller, R. R., Renner, H., Mughrabi, H., & Preston, A. (1996). On the unique evaluation of local lattice parameters by convergent-beam electron diffraction. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, 74(1), 23-43. https://doi.org/10.1080/01418619608239688
Maier HJ, Keller RR, Renner H, Mughrabi H, Preston A. On the unique evaluation of local lattice parameters by convergent-beam electron diffraction. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 1996 Jul;74(1):23-43. doi: 10.1080/01418619608239688
Maier, H. J. ; Keller, R. R. ; Renner, H. et al. / On the unique evaluation of local lattice parameters by convergent-beam electron diffraction. In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 1996 ; Vol. 74, No. 1. pp. 23-43.
Download
@article{75199764fb1b4a5093ead386404888e3,
title = "On the unique evaluation of local lattice parameters by convergent-beam electron diffraction",
abstract = "We summarize some practical aspects of using convergent-beam electron diffraction (CBED) patterns for determination of three-dimensional lattice parameters in crystalline materials. Owing to the insensitivities of certain lattice spacings to changes in lattice parameters, and to measurement errors imposed by finite higher-order Laue zone (HOLZ) linewidths, most CBED patterns can be simulated by a number of different lattice parameter combinations. Unique combinations are found by fitting several patterns obtained from the same area. In cases where a unique set of all six parameters cannot be found, semiquantitative information about elastic stress and strain states can still be extracted. The number of obtainable lattice parameters is affected by the symmetry of the pattern and by the specific HOLZ reflections which are present, for a given accelerating voltage. Symmetry-breaking distortions in patterns from nominally orthorhombic systems can often be attributed to deviations in lattice angles as small as 0 01-0 02° away from 90°, even if such angular distortions are not expected from knowledge of the material{\textquoteright}s bulk behaviour. The correct simulation of CBED patterns further requires consideration of foil thinning artefacts on HOLZ line positions. We show that an intelligent choice of zone axis can provide useful information even from difficult sample geometries.",
author = "Maier, {H. J.} and Keller, {R. R.} and H. Renner and H. Mughrabi and A. Preston",
note = "Funding Information: ACICNOWLEDGMEWS Financial support by the Deutsche Forschungsgemeinschaft and the Volkswagen Stiftung are gratefully acknowledged. One of the authors (R.R.K.) additionally thanks the National Research Council Past-Doctoral Research Associateship",
year = "1996",
month = jul,
doi = "10.1080/01418619608239688",
language = "English",
volume = "74",
pages = "23--43",
number = "1",

}

Download

TY - JOUR

T1 - On the unique evaluation of local lattice parameters by convergent-beam electron diffraction

AU - Maier, H. J.

AU - Keller, R. R.

AU - Renner, H.

AU - Mughrabi, H.

AU - Preston, A.

N1 - Funding Information: ACICNOWLEDGMEWS Financial support by the Deutsche Forschungsgemeinschaft and the Volkswagen Stiftung are gratefully acknowledged. One of the authors (R.R.K.) additionally thanks the National Research Council Past-Doctoral Research Associateship

PY - 1996/7

Y1 - 1996/7

N2 - We summarize some practical aspects of using convergent-beam electron diffraction (CBED) patterns for determination of three-dimensional lattice parameters in crystalline materials. Owing to the insensitivities of certain lattice spacings to changes in lattice parameters, and to measurement errors imposed by finite higher-order Laue zone (HOLZ) linewidths, most CBED patterns can be simulated by a number of different lattice parameter combinations. Unique combinations are found by fitting several patterns obtained from the same area. In cases where a unique set of all six parameters cannot be found, semiquantitative information about elastic stress and strain states can still be extracted. The number of obtainable lattice parameters is affected by the symmetry of the pattern and by the specific HOLZ reflections which are present, for a given accelerating voltage. Symmetry-breaking distortions in patterns from nominally orthorhombic systems can often be attributed to deviations in lattice angles as small as 0 01-0 02° away from 90°, even if such angular distortions are not expected from knowledge of the material’s bulk behaviour. The correct simulation of CBED patterns further requires consideration of foil thinning artefacts on HOLZ line positions. We show that an intelligent choice of zone axis can provide useful information even from difficult sample geometries.

AB - We summarize some practical aspects of using convergent-beam electron diffraction (CBED) patterns for determination of three-dimensional lattice parameters in crystalline materials. Owing to the insensitivities of certain lattice spacings to changes in lattice parameters, and to measurement errors imposed by finite higher-order Laue zone (HOLZ) linewidths, most CBED patterns can be simulated by a number of different lattice parameter combinations. Unique combinations are found by fitting several patterns obtained from the same area. In cases where a unique set of all six parameters cannot be found, semiquantitative information about elastic stress and strain states can still be extracted. The number of obtainable lattice parameters is affected by the symmetry of the pattern and by the specific HOLZ reflections which are present, for a given accelerating voltage. Symmetry-breaking distortions in patterns from nominally orthorhombic systems can often be attributed to deviations in lattice angles as small as 0 01-0 02° away from 90°, even if such angular distortions are not expected from knowledge of the material’s bulk behaviour. The correct simulation of CBED patterns further requires consideration of foil thinning artefacts on HOLZ line positions. We show that an intelligent choice of zone axis can provide useful information even from difficult sample geometries.

UR - http://www.scopus.com/inward/record.url?scp=0041113837&partnerID=8YFLogxK

U2 - 10.1080/01418619608239688

DO - 10.1080/01418619608239688

M3 - Article

AN - SCOPUS:0041113837

VL - 74

SP - 23

EP - 43

JO - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

JF - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

SN - 0141-8610

IS - 1

ER -

By the same author(s)