On Investigating the Effect of DC Biased Ripple Voltages over the Insulation of Bus Capacitor of Power Inverters: Possibility and Limitations

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  • K.N. Toosi University of Technology
  • Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU Erlangen-Nürnberg)
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Details

Original languageEnglish
Pages (from-to)997-1002
Number of pages6
JournalIEEE Transactions on Dielectrics and Electrical Insulation
Volume31
Issue number2
Early online date5 Jan 2024
Publication statusPublished - Apr 2024

Abstract

With growing advances in semiconductor technologies and the introduction of new topologies in power networks, the implementation of power converters has dramatically increased. Such variations may impose additional electrical stresses and lead to failures in insulation systems. In this regard, understanding the behavior of insulation is of paramount importance. Conventionally, spectroscopy of insulations is performed under sinusoidal voltage waveforms, while there are certain conditions where the insulation is subjected to a non-sinusoidal voltage waveform with a possible DC bias. A good example of this situation could be the bus capacitor of power converters, where the capacitor on the DC voltage side provides a low-impedance loop for current ripple originating from the converter topology or load behavior. In this paper, the complex permittivity of the insulation was extracted under DC-biased sinusoidal and non-sinusoidal voltage waveforms. The challenges associated with such measurements have been addressed, and finally, the results over a typical sample are presented and discussed.

Keywords

    bus capacitor, Capacitors, Current measurement, dielectric spectroscopy, Dielectrics, Impedance, Insulation, Permittivity measurement, ripple voltage, variable speed drives, Voltage measurement, Bus capacitor

ASJC Scopus subject areas

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On Investigating the Effect of DC Biased Ripple Voltages over the Insulation of Bus Capacitor of Power Inverters: Possibility and Limitations. / Sargazi, Reza; Werle, Peter; Akbari, Asghar et al.
In: IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 31, No. 2, 04.2024, p. 997-1002.

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