Details
Original language | English |
---|---|
Pages (from-to) | 215-224 |
Number of pages | 10 |
Journal | Energy Procedia |
Volume | 77 |
Early online date | 28 Aug 2015 |
Publication status | Published - Aug 2015 |
Event | 5th International Conference on Silicon Photovoltaics, SiliconPV 2015 - Konstanz, Germany Duration: 25 Mar 2015 → 27 Mar 2015 |
Abstract
Commonly, the thermal behavior of solar cell modules is calculated with analytical approaches using non wavelength-dependent optical data. Here, we employ ray tracing of entire solar modules at wavelengths of 300-2500 nm to calculate heat sources. Subsequently, finite element method (FEM) simulations are used to solve the semiconductor equations coupled with the thermal conduction, thermal convection, and thermal radiation equations. The implemented model is validated with measurements from an outdoor test over the period of an entire year. Our ray tracing analysis of different solar modules under the AM.15G spectrum shows that, for a standard module about 18.9% of the sun's intensity becomes parasitically absorbed. A loss analysis shows that the biggest parasitic heat source is the cell's full-area rear side metallization. We hence propose the use of a SiNx layer as rear side mirror to reduce the parasitic absorption to 11.7%. This change can lead to a 3.2 °C lower module operating temperature, which results in an about 5 W higher electrical power output when considering a typical 260 W module.
Keywords
- dielectric rear side mirror, Ray tracing, simlation, solar module temperature;field measurements, thermal solar module behaviour
ASJC Scopus subject areas
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In: Energy Procedia, Vol. 77, 08.2015, p. 215-224.
Research output: Contribution to journal › Conference article › Research › peer review
}
TY - JOUR
T1 - Numerical Modeling of c-Si PV Modules by Coupling the Semiconductor with the Thermal Conduction, Convection and Radiation Equations
AU - Holst, Hendrik
AU - Brendel, Rolf
AU - Altermatt, Pietro P.
AU - Winter, Matthias
AU - Vogt, Malte R.
N1 - Publisher Copyright: © 2015 The Authors.
PY - 2015/8
Y1 - 2015/8
N2 - Commonly, the thermal behavior of solar cell modules is calculated with analytical approaches using non wavelength-dependent optical data. Here, we employ ray tracing of entire solar modules at wavelengths of 300-2500 nm to calculate heat sources. Subsequently, finite element method (FEM) simulations are used to solve the semiconductor equations coupled with the thermal conduction, thermal convection, and thermal radiation equations. The implemented model is validated with measurements from an outdoor test over the period of an entire year. Our ray tracing analysis of different solar modules under the AM.15G spectrum shows that, for a standard module about 18.9% of the sun's intensity becomes parasitically absorbed. A loss analysis shows that the biggest parasitic heat source is the cell's full-area rear side metallization. We hence propose the use of a SiNx layer as rear side mirror to reduce the parasitic absorption to 11.7%. This change can lead to a 3.2 °C lower module operating temperature, which results in an about 5 W higher electrical power output when considering a typical 260 W module.
AB - Commonly, the thermal behavior of solar cell modules is calculated with analytical approaches using non wavelength-dependent optical data. Here, we employ ray tracing of entire solar modules at wavelengths of 300-2500 nm to calculate heat sources. Subsequently, finite element method (FEM) simulations are used to solve the semiconductor equations coupled with the thermal conduction, thermal convection, and thermal radiation equations. The implemented model is validated with measurements from an outdoor test over the period of an entire year. Our ray tracing analysis of different solar modules under the AM.15G spectrum shows that, for a standard module about 18.9% of the sun's intensity becomes parasitically absorbed. A loss analysis shows that the biggest parasitic heat source is the cell's full-area rear side metallization. We hence propose the use of a SiNx layer as rear side mirror to reduce the parasitic absorption to 11.7%. This change can lead to a 3.2 °C lower module operating temperature, which results in an about 5 W higher electrical power output when considering a typical 260 W module.
KW - dielectric rear side mirror
KW - Ray tracing
KW - simlation
KW - solar module temperature;field measurements
KW - thermal solar module behaviour
UR - http://www.scopus.com/inward/record.url?scp=84948429655&partnerID=8YFLogxK
U2 - 10.1016/j.egypro.2015.07.030
DO - 10.1016/j.egypro.2015.07.030
M3 - Conference article
AN - SCOPUS:84948429655
VL - 77
SP - 215
EP - 224
JO - Energy Procedia
JF - Energy Procedia
SN - 1876-6102
T2 - 5th International Conference on Silicon Photovoltaics, SiliconPV 2015
Y2 - 25 March 2015 through 27 March 2015
ER -