Loading [MathJax]/extensions/tex2jax.js

Non-Overlap Image Registration

Research output: Contribution to conferencePosterResearch

Authors

Details

Original languageEnglish
Pages282-283
Publication statusPublished - 2023
EventSensor and Measurement Science International - Nürnberg, Germany
Duration: 8 May 202311 May 2023
Conference number: 2023
https://www.smsi-conference.com/

Conference

ConferenceSensor and Measurement Science International
Abbreviated titleSMSI
Country/TerritoryGermany
CityNürnberg
Period8 May 202311 May 2023
Internet address

Abstract

This work aims to predict the relative position of non-overlapping image pairs consisting of a moving and a fixed image. For this purpose, a modified VGG16 convolutional neural network is proposed. The network is trained on a large dataset with microtopographic measurement data of different materials and processing methods. The proposed method shows a high prediction accuracy on the test data and the potential for developing non-overlap registration algorithms.

Cite this

Non-Overlap Image Registration. / Siemens, Stefan; Kästner, Markus; Reithmeier, Eduard.
2023. 282-283 Poster session presented at Sensor and Measurement Science International, Nürnberg, Germany.

Research output: Contribution to conferencePosterResearch

Siemens, S, Kästner, M & Reithmeier, E 2023, 'Non-Overlap Image Registration', Sensor and Measurement Science International, Nürnberg, Germany, 8 May 2023 - 11 May 2023 pp. 282-283. https://doi.org/10.5162/smsi2023/p01
Siemens, S., Kästner, M., & Reithmeier, E. (2023). Non-Overlap Image Registration. 282-283. Poster session presented at Sensor and Measurement Science International, Nürnberg, Germany. https://doi.org/10.5162/smsi2023/p01
Siemens S, Kästner M, Reithmeier E. Non-Overlap Image Registration. 2023. Poster session presented at Sensor and Measurement Science International, Nürnberg, Germany. doi: 10.5162/smsi2023/p01
Siemens, Stefan ; Kästner, Markus ; Reithmeier, Eduard. / Non-Overlap Image Registration. Poster session presented at Sensor and Measurement Science International, Nürnberg, Germany.
Download
@conference{1e0ad57e81a64c4bb6c85d0920e5baff,
title = "Non-Overlap Image Registration",
abstract = "This work aims to predict the relative position of non-overlapping image pairs consisting of a moving and a fixed image. For this purpose, a modified VGG16 convolutional neural network is proposed. The network is trained on a large dataset with microtopographic measurement data of different materials and processing methods. The proposed method shows a high prediction accuracy on the test data and the potential for developing non-overlap registration algorithms.",
author = "Stefan Siemens and Markus K{\"a}stner and Eduard Reithmeier",
year = "2023",
doi = "10.5162/smsi2023/p01",
language = "English",
pages = "282--283",
note = "Sensor and Measurement Science International, SMSI ; Conference date: 08-05-2023 Through 11-05-2023",
url = "https://www.smsi-conference.com/",

}

Download

TY - CONF

T1 - Non-Overlap Image Registration

AU - Siemens, Stefan

AU - Kästner, Markus

AU - Reithmeier, Eduard

N1 - Conference code: 2023

PY - 2023

Y1 - 2023

N2 - This work aims to predict the relative position of non-overlapping image pairs consisting of a moving and a fixed image. For this purpose, a modified VGG16 convolutional neural network is proposed. The network is trained on a large dataset with microtopographic measurement data of different materials and processing methods. The proposed method shows a high prediction accuracy on the test data and the potential for developing non-overlap registration algorithms.

AB - This work aims to predict the relative position of non-overlapping image pairs consisting of a moving and a fixed image. For this purpose, a modified VGG16 convolutional neural network is proposed. The network is trained on a large dataset with microtopographic measurement data of different materials and processing methods. The proposed method shows a high prediction accuracy on the test data and the potential for developing non-overlap registration algorithms.

U2 - 10.5162/smsi2023/p01

DO - 10.5162/smsi2023/p01

M3 - Poster

SP - 282

EP - 283

T2 - Sensor and Measurement Science International

Y2 - 8 May 2023 through 11 May 2023

ER -

By the same author(s)