Details
Original language | English |
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Title of host publication | Electromagnetic Nondestructive Evaluation (XII) |
Editors | Young-Kil Shin, Hyang-Beom Lee, Sung-Jin Song |
Publisher | IOS Press |
Pages | 131-139 |
Number of pages | 9 |
ISBN (print) | 978-1-60750-023-0 |
Publication status | Published - 2009 |
Publication series
Name | Studies in Applied Electromagnetics and Mechanics |
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Publisher | IOS Press |
Volume | 32 |
ISSN (electronic) | 1383-7281 |
Cite this
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Electromagnetic Nondestructive Evaluation (XII). ed. / Young-Kil Shin; Hyang-Beom Lee; Sung-Jin Song. IOS Press, 2009. p. 131-139 (Studies in Applied Electromagnetics and Mechanics; Vol. 32).
Research output: Chapter in book/report/conference proceeding › Contribution to book/anthology › Research › peer review
}
TY - CHAP
T1 - Nondestructive Characterizing Stress States in Conventional Deep Drawing Processes by Means of Electromagnetic Methods
AU - Altpeter, Iris
AU - Sklarczyk, Christoph
AU - Kopp, Melanie
AU - Kröning, Michael
AU - Hübner, Sven
AU - Behrens, Bernd-Arno
PY - 2009
Y1 - 2009
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-77957660164&partnerID=MN8TOARS
U2 - 10.3233/978-1-60750-023-0-131
DO - 10.3233/978-1-60750-023-0-131
M3 - Contribution to book/anthology
SN - 978-1-60750-023-0
T3 - Studies in Applied Electromagnetics and Mechanics
SP - 131
EP - 139
BT - Electromagnetic Nondestructive Evaluation (XII)
A2 - Shin, Young-Kil
A2 - Lee, Hyang-Beom
A2 - Song, Sung-Jin
PB - IOS Press
ER -