Details
Original language | English |
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Title of host publication | Coatings in Manufacturing Engineering |
Pages | 123-129 |
Number of pages | 7 |
Publication status | Published - May 2010 |
Event | 8th International Conference on the Coatings in Manufacturing Engineering - Erlangen, Germany Duration: 14 Apr 2010 → 15 Apr 2010 |
Publication series
Name | Key Engineering Materials |
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Volume | 438 |
ISSN (Print) | 1013-9826 |
ISSN (electronic) | 1662-9795 |
Abstract
In order to produce optically cooperative surfaces to use triangulation measuring systems, the methods of surface and thin-coating technology are resorted to. Among these number physical methods such as PVD technology, (electro-)chemical treatment as, for example, electrochemical etching and electroless coatings as well as mechanical treatments of the components by means of glass-bead and corundum blasting. The processes mentioned are suitable for producing optically cooperative surfaces since, owing to the corresponding test parameters, a change of the component's surface occurs at the sub-micrometer scale. Currently, no indication in the literature is provided that such processes are employed for manufacturing optically cooperative surfaces vis-à-vis triangulation methods.
Keywords
- Optically non-cooperative surfaces, Surface metrology, Surface technology
ASJC Scopus subject areas
- Materials Science(all)
- General Materials Science
- Engineering(all)
- Mechanics of Materials
- Engineering(all)
- Mechanical Engineering
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Coatings in Manufacturing Engineering. 2010. p. 123-129 (Key Engineering Materials; Vol. 438).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Non-contact geometry inspection of workpieces with optically non-cooperative surfaces
AU - Bach, Friedrich Wilhelm
AU - Möhwald, Kai
AU - Nicolaus, Martin
AU - Reithmeier, Eduard
AU - Kästner, Markus
AU - Abo-Namous, Omar
PY - 2010/5
Y1 - 2010/5
N2 - In order to produce optically cooperative surfaces to use triangulation measuring systems, the methods of surface and thin-coating technology are resorted to. Among these number physical methods such as PVD technology, (electro-)chemical treatment as, for example, electrochemical etching and electroless coatings as well as mechanical treatments of the components by means of glass-bead and corundum blasting. The processes mentioned are suitable for producing optically cooperative surfaces since, owing to the corresponding test parameters, a change of the component's surface occurs at the sub-micrometer scale. Currently, no indication in the literature is provided that such processes are employed for manufacturing optically cooperative surfaces vis-à-vis triangulation methods.
AB - In order to produce optically cooperative surfaces to use triangulation measuring systems, the methods of surface and thin-coating technology are resorted to. Among these number physical methods such as PVD technology, (electro-)chemical treatment as, for example, electrochemical etching and electroless coatings as well as mechanical treatments of the components by means of glass-bead and corundum blasting. The processes mentioned are suitable for producing optically cooperative surfaces since, owing to the corresponding test parameters, a change of the component's surface occurs at the sub-micrometer scale. Currently, no indication in the literature is provided that such processes are employed for manufacturing optically cooperative surfaces vis-à-vis triangulation methods.
KW - Optically non-cooperative surfaces
KW - Surface metrology
KW - Surface technology
UR - http://www.scopus.com/inward/record.url?scp=77955544073&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/KEM.438.123
DO - 10.4028/www.scientific.net/KEM.438.123
M3 - Conference contribution
AN - SCOPUS:77955544073
SN - 0878492720
SN - 9780878492725
T3 - Key Engineering Materials
SP - 123
EP - 129
BT - Coatings in Manufacturing Engineering
T2 - 8th International Conference on the Coatings in Manufacturing Engineering
Y2 - 14 April 2010 through 15 April 2010
ER -