Details
| Original language | English |
|---|---|
| Title of host publication | Noise and Fluctuations |
| Subtitle of host publication | 20th International Conference on Noise and Fluctuations - ICNF 2009 |
| Pages | 465-468 |
| Number of pages | 4 |
| Publication status | Published - 4 May 2009 |
| Event | 20th International Conference on Noise and Fluctuations, ICNF 2009 - Pisa, Italy Duration: 14 Jun 2009 → 19 Jun 2009 |
Publication series
| Name | AIP Conference Proceedings |
|---|---|
| Volume | 1129 |
| ISSN (Print) | 0094-243X |
| ISSN (electronic) | 1551-7616 |
Abstract
The shot noise of a single parameter quantized charge pump is studied. The pumped current can be varied using a control gate. Quantized current plateaus / = nefp with fp the pumping frequency and e the electron charge are observed. The shot noise is minimal for each current plateau and maximal in between. Interestingly the first expected quantized current plateau at n = 1 is missing for certain control gate voltages. We use the measured shot noise to extract the probabilities for pumping none, one or two electrons at the position of the missing step. These probabilities can be used to characterize the dynamics of the non-adiabatic pumping process.
Keywords
- Quantized charge pump, Shot noise, Single electron effects
ASJC Scopus subject areas
- Physics and Astronomy(all)
- General Physics and Astronomy
Cite this
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Noise and Fluctuations: 20th International Conference on Noise and Fluctuations - ICNF 2009. 2009. p. 465-468 (AIP Conference Proceedings; Vol. 1129).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Noise characterization of a single parameter quantized charge pump
AU - Hohls, F.
AU - Maire, N.
AU - Kaestner, B.
AU - Pierz, K.
AU - Schumacher, H. W.
AU - Haug, R. J.
PY - 2009/5/4
Y1 - 2009/5/4
N2 - The shot noise of a single parameter quantized charge pump is studied. The pumped current can be varied using a control gate. Quantized current plateaus / = nefp with fp the pumping frequency and e the electron charge are observed. The shot noise is minimal for each current plateau and maximal in between. Interestingly the first expected quantized current plateau at n = 1 is missing for certain control gate voltages. We use the measured shot noise to extract the probabilities for pumping none, one or two electrons at the position of the missing step. These probabilities can be used to characterize the dynamics of the non-adiabatic pumping process.
AB - The shot noise of a single parameter quantized charge pump is studied. The pumped current can be varied using a control gate. Quantized current plateaus / = nefp with fp the pumping frequency and e the electron charge are observed. The shot noise is minimal for each current plateau and maximal in between. Interestingly the first expected quantized current plateau at n = 1 is missing for certain control gate voltages. We use the measured shot noise to extract the probabilities for pumping none, one or two electrons at the position of the missing step. These probabilities can be used to characterize the dynamics of the non-adiabatic pumping process.
KW - Quantized charge pump
KW - Shot noise
KW - Single electron effects
UR - http://www.scopus.com/inward/record.url?scp=67650473499&partnerID=8YFLogxK
U2 - 10.1063/1.3140501
DO - 10.1063/1.3140501
M3 - Conference contribution
AN - SCOPUS:67650473499
SN - 9780735406650
T3 - AIP Conference Proceedings
SP - 465
EP - 468
BT - Noise and Fluctuations
T2 - 20th International Conference on Noise and Fluctuations, ICNF 2009
Y2 - 14 June 2009 through 19 June 2009
ER -