NIR-CW-laser annealing of room temperature sputtered ZnO:Al

Research output: Contribution to journalConference articleResearchpeer review

Authors

  • Viktor Schütz
  • V. Sittinger
  • S. Götzendörfer
  • C. C. Kalmbach
  • R. Fu
  • Philipp von Witzendorff
  • C. Britze
  • Oliver Suttmann
  • Ludger Overmeyer

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
  • Fraunhofer-Institute for Surface Engineering and Thin Films (IST)
  • Berliner Glas Surface Technology
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Details

Original languageEnglish
Pages (from-to)1073-1082
Number of pages10
JournalPhysics Procedia
Volume56
Issue numberC
Publication statusPublished - 9 Sept 2014
Externally publishedYes
EventInternational Conference on Laser Assisted Net Shape Engineering, LANE 2014 - Fürth, Germany
Duration: 8 Sept 201411 Sept 2014

Abstract

Transparent Conducting Oxides (TCOs) are widespread as transparent electrodes in thin film photovoltaics and electronics. Post deposition furnace annealing improves the electrical and optical properties of TCOs. Disadvantages of furnace annealing are large energy consumption and long processing time due to long-lasting heating ramps. ZnO:Al thin films (AZO) with a low electrical resistivity and high transparency are usually sputtered at substrate temperatures up to several hundred °C. In this study post deposition near infrared (NIR) continuous wave (CW) laser annealing of room-temperature deposited AZO thin films is investigated. The surface temperature is determined by infrared thermography. The averaged transmittance is increased by T300-1100 nm ≤ 7.2 % due to a lower absorptance at a constant reflectance. The resistivity is reduced to ρ = 360 μΩcm, because of a higher electron mobility μ. These promising results show the potential of laser annealing for the replacement of furnace annealing in industrial applications.

Keywords

    Electro-optical parameters, Laser-annealing, TCO

ASJC Scopus subject areas

Sustainable Development Goals

Cite this

NIR-CW-laser annealing of room temperature sputtered ZnO:Al. / Schütz, Viktor; Sittinger, V.; Götzendörfer, S. et al.
In: Physics Procedia, Vol. 56, No. C, 09.09.2014, p. 1073-1082.

Research output: Contribution to journalConference articleResearchpeer review

Schütz, V, Sittinger, V, Götzendörfer, S, Kalmbach, CC, Fu, R, von Witzendorff, P, Britze, C, Suttmann, O & Overmeyer, L 2014, 'NIR-CW-laser annealing of room temperature sputtered ZnO:Al', Physics Procedia, vol. 56, no. C, pp. 1073-1082. https://doi.org/10.1016/j.phpro.2014.08.020
Schütz, V., Sittinger, V., Götzendörfer, S., Kalmbach, C. C., Fu, R., von Witzendorff, P., Britze, C., Suttmann, O., & Overmeyer, L. (2014). NIR-CW-laser annealing of room temperature sputtered ZnO:Al. Physics Procedia, 56(C), 1073-1082. https://doi.org/10.1016/j.phpro.2014.08.020
Schütz V, Sittinger V, Götzendörfer S, Kalmbach CC, Fu R, von Witzendorff P et al. NIR-CW-laser annealing of room temperature sputtered ZnO:Al. Physics Procedia. 2014 Sept 9;56(C):1073-1082. doi: 10.1016/j.phpro.2014.08.020
Schütz, Viktor ; Sittinger, V. ; Götzendörfer, S. et al. / NIR-CW-laser annealing of room temperature sputtered ZnO:Al. In: Physics Procedia. 2014 ; Vol. 56, No. C. pp. 1073-1082.
Download
@article{26db3a2e0e1748949f357e7a78d9478d,
title = "NIR-CW-laser annealing of room temperature sputtered ZnO:Al",
abstract = "Transparent Conducting Oxides (TCOs) are widespread as transparent electrodes in thin film photovoltaics and electronics. Post deposition furnace annealing improves the electrical and optical properties of TCOs. Disadvantages of furnace annealing are large energy consumption and long processing time due to long-lasting heating ramps. ZnO:Al thin films (AZO) with a low electrical resistivity and high transparency are usually sputtered at substrate temperatures up to several hundred °C. In this study post deposition near infrared (NIR) continuous wave (CW) laser annealing of room-temperature deposited AZO thin films is investigated. The surface temperature is determined by infrared thermography. The averaged transmittance is increased by T300-1100 nm ≤ 7.2 % due to a lower absorptance at a constant reflectance. The resistivity is reduced to ρ = 360 μΩcm, because of a higher electron mobility μ. These promising results show the potential of laser annealing for the replacement of furnace annealing in industrial applications.",
keywords = "Electro-optical parameters, Laser-annealing, TCO",
author = "Viktor Sch{\"u}tz and V. Sittinger and S. G{\"o}tzend{\"o}rfer and Kalmbach, {C. C.} and R. Fu and {von Witzendorff}, Philipp and C. Britze and Oliver Suttmann and Ludger Overmeyer",
note = "Funding information: This work has been funded by the German “Federal Ministry for the Environment, Nature Conservation, Building and Nuclear Safety”, Contract No. 0325299A.; International Conference on Laser Assisted Net Shape Engineering, LANE 2014 ; Conference date: 08-09-2014 Through 11-09-2014",
year = "2014",
month = sep,
day = "9",
doi = "10.1016/j.phpro.2014.08.020",
language = "English",
volume = "56",
pages = "1073--1082",
number = "C",

}

Download

TY - JOUR

T1 - NIR-CW-laser annealing of room temperature sputtered ZnO:Al

AU - Schütz, Viktor

AU - Sittinger, V.

AU - Götzendörfer, S.

AU - Kalmbach, C. C.

AU - Fu, R.

AU - von Witzendorff, Philipp

AU - Britze, C.

AU - Suttmann, Oliver

AU - Overmeyer, Ludger

N1 - Funding information: This work has been funded by the German “Federal Ministry for the Environment, Nature Conservation, Building and Nuclear Safety”, Contract No. 0325299A.

PY - 2014/9/9

Y1 - 2014/9/9

N2 - Transparent Conducting Oxides (TCOs) are widespread as transparent electrodes in thin film photovoltaics and electronics. Post deposition furnace annealing improves the electrical and optical properties of TCOs. Disadvantages of furnace annealing are large energy consumption and long processing time due to long-lasting heating ramps. ZnO:Al thin films (AZO) with a low electrical resistivity and high transparency are usually sputtered at substrate temperatures up to several hundred °C. In this study post deposition near infrared (NIR) continuous wave (CW) laser annealing of room-temperature deposited AZO thin films is investigated. The surface temperature is determined by infrared thermography. The averaged transmittance is increased by T300-1100 nm ≤ 7.2 % due to a lower absorptance at a constant reflectance. The resistivity is reduced to ρ = 360 μΩcm, because of a higher electron mobility μ. These promising results show the potential of laser annealing for the replacement of furnace annealing in industrial applications.

AB - Transparent Conducting Oxides (TCOs) are widespread as transparent electrodes in thin film photovoltaics and electronics. Post deposition furnace annealing improves the electrical and optical properties of TCOs. Disadvantages of furnace annealing are large energy consumption and long processing time due to long-lasting heating ramps. ZnO:Al thin films (AZO) with a low electrical resistivity and high transparency are usually sputtered at substrate temperatures up to several hundred °C. In this study post deposition near infrared (NIR) continuous wave (CW) laser annealing of room-temperature deposited AZO thin films is investigated. The surface temperature is determined by infrared thermography. The averaged transmittance is increased by T300-1100 nm ≤ 7.2 % due to a lower absorptance at a constant reflectance. The resistivity is reduced to ρ = 360 μΩcm, because of a higher electron mobility μ. These promising results show the potential of laser annealing for the replacement of furnace annealing in industrial applications.

KW - Electro-optical parameters

KW - Laser-annealing

KW - TCO

UR - http://www.scopus.com/inward/record.url?scp=84923138969&partnerID=8YFLogxK

U2 - 10.1016/j.phpro.2014.08.020

DO - 10.1016/j.phpro.2014.08.020

M3 - Conference article

AN - SCOPUS:84923138969

VL - 56

SP - 1073

EP - 1082

JO - Physics Procedia

JF - Physics Procedia

SN - 1875-3884

IS - C

T2 - International Conference on Laser Assisted Net Shape Engineering, LANE 2014

Y2 - 8 September 2014 through 11 September 2014

ER -