Details
| Original language | English |
|---|---|
| Title of host publication | 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010 |
| Editors | J.M. Janiszewski, G. Lewandowski, Z. M. Joskiewicz, A. Kozlowska |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 873-877 |
| Number of pages | 5 |
| ISBN (print) | 9788374934268 |
| Publication status | Published - 6 Jan 2025 |
| Event | 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010 - Wroclaw, Poland Duration: 13 Sept 2010 → 17 Sept 2010 |
Abstract
A measurement method for a multipole approximation of arbitrary electromagnetic sources is motivated and described. In order to analyze the influences of different error sources, a method for the comparison of radiation patterns is introduced and the one dimensional correlation coefficient is identified as a quality factor for the similarity of radiation patterns. The quality factor is used for the analysis of different sources of errors, which can occur in measurements. The paper shows, that one of the main influences on multipole approximations are reflections.
Keywords
- correlation, multipole approximation, simulation, uncertainty consideration
ASJC Scopus subject areas
- Engineering(all)
- Automotive Engineering
- Engineering(all)
- Electrical and Electronic Engineering
- Medicine(all)
- Public Health, Environmental and Occupational Health
- Physics and Astronomy(all)
- Instrumentation
- Computer Science(all)
- Computer Networks and Communications
- Engineering(all)
- Safety, Risk, Reliability and Quality
- Physics and Astronomy(all)
- Radiation
- Social Sciences(all)
- Law
Sustainable Development Goals
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9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010. ed. / J.M. Janiszewski; G. Lewandowski; Z. M. Joskiewicz; A. Kozlowska. Institute of Electrical and Electronics Engineers Inc., 2025. p. 873-877.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
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TY - GEN
T1 - Multipole Parameters Out of Measurements
T2 - 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010
AU - Doering, Oliver
AU - Genender, Evgeni
AU - Garbe, Heyno
PY - 2025/1/6
Y1 - 2025/1/6
N2 - A measurement method for a multipole approximation of arbitrary electromagnetic sources is motivated and described. In order to analyze the influences of different error sources, a method for the comparison of radiation patterns is introduced and the one dimensional correlation coefficient is identified as a quality factor for the similarity of radiation patterns. The quality factor is used for the analysis of different sources of errors, which can occur in measurements. The paper shows, that one of the main influences on multipole approximations are reflections.
AB - A measurement method for a multipole approximation of arbitrary electromagnetic sources is motivated and described. In order to analyze the influences of different error sources, a method for the comparison of radiation patterns is introduced and the one dimensional correlation coefficient is identified as a quality factor for the similarity of radiation patterns. The quality factor is used for the analysis of different sources of errors, which can occur in measurements. The paper shows, that one of the main influences on multipole approximations are reflections.
KW - correlation
KW - multipole approximation
KW - simulation
KW - uncertainty consideration
UR - http://www.scopus.com/inward/record.url?scp=85217265497&partnerID=8YFLogxK
U2 - 10.23919/EMC.2010.10826237
DO - 10.23919/EMC.2010.10826237
M3 - Conference contribution
AN - SCOPUS:85217265497
SN - 9788374934268
SP - 873
EP - 877
BT - 9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010
A2 - Janiszewski, J.M.
A2 - Lewandowski, G.
A2 - Joskiewicz, Z. M.
A2 - Kozlowska, A.
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 13 September 2010 through 17 September 2010
ER -