Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • David Miller
  • Cari Herrmann
  • Hans Maier
  • Steve George
  • Conrad Stoldt
  • Ken Gall

External Research Organisations

  • University of Colorado Boulder
  • Paderborn University
View graph of relations

Details

Original languageEnglish
Title of host publicationStability of Thin Films and Nanostructures
PublisherMaterials Research Society
Pages131-136
Number of pages6
ISBN (print)1558998063, 9781558998063
Publication statusPublished - 2004
Externally publishedYes
Event2004 MRS Fall Meeting - Boston, MA, United States
Duration: 29 Nov 20043 Dec 2004

Publication series

NameMaterials Research Society Symposium Proceedings
Volume854
ISSN (Print)0272-9172

Abstract

Au/Cr/Si microcantilevers were studied in their as-deposited condition and annealed state, with emphasis on a thermal treatment of 225 °C for 24 hours. Change in beam curvature was monitored during isothermal hold as a function of time. Secondary grain growth was observed in the gold, which contained non-uniformly distributed twins and dislocation defects, Diffusional transport of the chromium layer was observed during annealing. Nodules arranged in the "rolling hill" topography were observed at the free surface, both before and after annealing. Nanometer thick coatings of alumina grown by atomic layer deposition improved the uniformity of both microstructure evolution and curvature evolution during high-temperature annealing.

ASJC Scopus subject areas

Cite this

Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. / Miller, David; Herrmann, Cari; Maier, Hans et al.
Stability of Thin Films and Nanostructures. Materials Research Society, 2004. p. 131-136 (Materials Research Society Symposium Proceedings; Vol. 854).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Miller, D, Herrmann, C, Maier, H, George, S, Stoldt, C & Gall, K 2004, Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. in Stability of Thin Films and Nanostructures. Materials Research Society Symposium Proceedings, vol. 854, Materials Research Society, pp. 131-136, 2004 MRS Fall Meeting, Boston, MA, United States, 29 Nov 2004. https://doi.org/10.1557/proc-854-u7.5
Miller, D., Herrmann, C., Maier, H., George, S., Stoldt, C., & Gall, K. (2004). Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. In Stability of Thin Films and Nanostructures (pp. 131-136). (Materials Research Society Symposium Proceedings; Vol. 854). Materials Research Society. https://doi.org/10.1557/proc-854-u7.5
Miller D, Herrmann C, Maier H, George S, Stoldt C, Gall K. Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. In Stability of Thin Films and Nanostructures. Materials Research Society. 2004. p. 131-136. (Materials Research Society Symposium Proceedings). doi: 10.1557/proc-854-u7.5
Miller, David ; Herrmann, Cari ; Maier, Hans et al. / Morphology and microstructure evolution of multilayer Au/Cr/Si thin films subject to annealing. Stability of Thin Films and Nanostructures. Materials Research Society, 2004. pp. 131-136 (Materials Research Society Symposium Proceedings).
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