Modern topics in standardized laser-induced damage threshold measurements

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Kai Starke
  • Holger Blaschke
  • Marco Jupé
  • Marc Lappschies
  • Detlev Ristau

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
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Details

Original languageEnglish
Title of host publicationOptical Fabrication, Testing, and Metrology II
Subtitle of host publication13 - 15 September 2005, Jena, Germany
Place of PublicationBellingham
PublisherSPIE
ISBN (print)0-8194-5983-6
Publication statusPublished - 19 Oct 2005
Externally publishedYes
EventOptical Fabrication, Testing, and Metrology II - Jena, Germany
Duration: 13 Sept 200515 Sept 2005

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume5965
ISSN (Print)0277-786X

Abstract

Although the measurement of the laser-induced damage threshold is a field of permanent research effort since the late 1960s, the optimization of the damage handling capability is still a key issue for the development of high performance laser systems. In conjunction with the ever increasing demand for lasers with high average power, energy, extreme wavelengths or short pulses, the resistance to laser damage has to be optimized with a special regard to the different damage mechanisms. Therefore, a report of the current status of the laser-induced damage threshold is given for the most interesting components and laser systems applied in science and industry. Further, several results of recently performed damage investigations in the NIR spectral range and for ultra short pulses are presented in this paper. The reliability of damage threshold measurements is crucially depending on the chosen test parameters. The importance of the different parameter values were investigated carefully during several Round-Robin experiments. These investigations can be regarded as the basis of the standardization process leading to the International Standard ISO 11254. In this paper, selected results of the comparative campaigns in damage testing are described, especially in the field of ns and fs pulses.

Keywords

    fs-pulses, ISO 11254, Laser-induced damage threshold, Round-Robin, Standardized measurement

ASJC Scopus subject areas

Cite this

Modern topics in standardized laser-induced damage threshold measurements. / Starke, Kai; Blaschke, Holger; Jupé, Marco et al.
Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Bellingham: SPIE, 2005. (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 5965).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Starke, K, Blaschke, H, Jupé, M, Lappschies, M & Ristau, D 2005, Modern topics in standardized laser-induced damage threshold measurements. in Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Proceedings of SPIE - The International Society for Optical Engineering, vol. 5965, SPIE, Bellingham, Optical Fabrication, Testing, and Metrology II, Jena, Germany, 13 Sept 2005. https://doi.org/10.1117/12.629055
Starke, K., Blaschke, H., Jupé, M., Lappschies, M., & Ristau, D. (2005). Modern topics in standardized laser-induced damage threshold measurements. In Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 5965). SPIE. https://doi.org/10.1117/12.629055
Starke K, Blaschke H, Jupé M, Lappschies M, Ristau D. Modern topics in standardized laser-induced damage threshold measurements. In Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Bellingham: SPIE. 2005. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.629055
Starke, Kai ; Blaschke, Holger ; Jupé, Marco et al. / Modern topics in standardized laser-induced damage threshold measurements. Optical Fabrication, Testing, and Metrology II: 13 - 15 September 2005, Jena, Germany. Bellingham : SPIE, 2005. (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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