Modeling substrate currents in smart power ICs

Research output: Contribution to journalConference articleResearchpeer review

Authors

  • Joerg Oehmen
  • Markus Olbrich
  • Erich Barke

Research Organisations

View graph of relations

Details

Original languageEnglish
Article numberIP-P5
Pages (from-to)127-130
Number of pages4
JournalProceedings of the International Symposium on Power Semiconductor Devices and ICs
Publication statusPublished - 2005
Event17th International Symposium on Power Semiconductor Devices and ICs, ISPSD'05 - Sanata Barbara, CA, United States
Duration: 23 May 200526 May 2005

Abstract

Switching of power stages in smart power ICs, which drive an inductive load, turns on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. We present a new parasitic transistor model for post layout simulation, which accounts for a strongly inhomogeneous current flow, a base width of up to a few hundred μm, multiple base contacts and collectors, and whose parameters are easily extractable from layout and technology data.

ASJC Scopus subject areas

Cite this

Modeling substrate currents in smart power ICs. / Oehmen, Joerg; Olbrich, Markus; Barke, Erich.
In: Proceedings of the International Symposium on Power Semiconductor Devices and ICs, 2005, p. 127-130.

Research output: Contribution to journalConference articleResearchpeer review

Oehmen, J, Olbrich, M & Barke, E 2005, 'Modeling substrate currents in smart power ICs', Proceedings of the International Symposium on Power Semiconductor Devices and ICs, pp. 127-130.
Oehmen, J., Olbrich, M., & Barke, E. (2005). Modeling substrate currents in smart power ICs. Proceedings of the International Symposium on Power Semiconductor Devices and ICs, 127-130. Article IP-P5.
Oehmen J, Olbrich M, Barke E. Modeling substrate currents in smart power ICs. Proceedings of the International Symposium on Power Semiconductor Devices and ICs. 2005;127-130. IP-P5.
Oehmen, Joerg ; Olbrich, Markus ; Barke, Erich. / Modeling substrate currents in smart power ICs. In: Proceedings of the International Symposium on Power Semiconductor Devices and ICs. 2005 ; pp. 127-130.
Download
@article{c50d777e6463428cb1eb8b20a1f376dc,
title = "Modeling substrate currents in smart power ICs",
abstract = "Switching of power stages in smart power ICs, which drive an inductive load, turns on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. We present a new parasitic transistor model for post layout simulation, which accounts for a strongly inhomogeneous current flow, a base width of up to a few hundred μm, multiple base contacts and collectors, and whose parameters are easily extractable from layout and technology data.",
author = "Joerg Oehmen and Markus Olbrich and Erich Barke",
year = "2005",
language = "English",
pages = "127--130",
note = "17th International Symposium on Power Semiconductor Devices and ICs, ISPSD'05 ; Conference date: 23-05-2005 Through 26-05-2005",

}

Download

TY - JOUR

T1 - Modeling substrate currents in smart power ICs

AU - Oehmen, Joerg

AU - Olbrich, Markus

AU - Barke, Erich

PY - 2005

Y1 - 2005

N2 - Switching of power stages in smart power ICs, which drive an inductive load, turns on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. We present a new parasitic transistor model for post layout simulation, which accounts for a strongly inhomogeneous current flow, a base width of up to a few hundred μm, multiple base contacts and collectors, and whose parameters are easily extractable from layout and technology data.

AB - Switching of power stages in smart power ICs, which drive an inductive load, turns on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. We present a new parasitic transistor model for post layout simulation, which accounts for a strongly inhomogeneous current flow, a base width of up to a few hundred μm, multiple base contacts and collectors, and whose parameters are easily extractable from layout and technology data.

UR - http://www.scopus.com/inward/record.url?scp=27744541928&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:27744541928

SP - 127

EP - 130

JO - Proceedings of the International Symposium on Power Semiconductor Devices and ICs

JF - Proceedings of the International Symposium on Power Semiconductor Devices and ICs

SN - 1063-6854

M1 - IP-P5

T2 - 17th International Symposium on Power Semiconductor Devices and ICs, ISPSD'05

Y2 - 23 May 2005 through 26 May 2005

ER -