Modeling and simulation of a complete semiconductor manufacturing facility using Petri nets

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Matthias Becker
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Details

Original languageEnglish
Title of host publicationEFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696)
Pages153-156
Number of pages4
Publication statusPublished - 2003
Event2003 IEEE Conference on Emerging Technologies and Factory Automation, ETFA 2003 - Lisbon, Portugal
Duration: 16 Sept 200319 Sept 2003

Publication series

NameIEEE International Conference on Emerging Technologies and Factory Automation, ETFA
ISSN (Print)1946-0740

Abstract

Most studies employing Petri nets in semiconductor manufacturing model only one specific area (e.g. etching) in detail, and model the rest of the manufacturing process, e.g. by abstract input/output behavior. In our study, we show the feasibility of using Petri nets for modeling the complete production process. We use the first set of test data provided by the MASM-LAB, Arizona State University. It is a process of a two-product system making non-volatile memory chips. For modeling, we use our own tool PSim, which is based on a combined queuing and Petri net formalism. The integration of queues makes the modeling of parts waiting in front of a machine quite concise and intuitive. PSim offers a hierarchical and modular modeling approach, which is especially feasible for large and complex systems. We use the modular approach by once defining the structure of a machine as Petri net and then instantiating as many machines as needed. Then we model the operators, resources and the movement of parts between the machines as specified in the production plan. As a result, we can state that Petri nets are feasible for modeling a complete semiconductor manufacturing process.

ASJC Scopus subject areas

Cite this

Modeling and simulation of a complete semiconductor manufacturing facility using Petri nets. / Becker, Matthias.
EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696). 2003. p. 153-156 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Becker, M 2003, Modeling and simulation of a complete semiconductor manufacturing facility using Petri nets. in EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696). IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, pp. 153-156, 2003 IEEE Conference on Emerging Technologies and Factory Automation, ETFA 2003, Lisbon, Portugal, 16 Sept 2003. https://doi.org/10.1109/ETFA.2003.1248687
Becker, M. (2003). Modeling and simulation of a complete semiconductor manufacturing facility using Petri nets. In EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696) (pp. 153-156). (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA). https://doi.org/10.1109/ETFA.2003.1248687
Becker M. Modeling and simulation of a complete semiconductor manufacturing facility using Petri nets. In EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696). 2003. p. 153-156. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA). doi: 10.1109/ETFA.2003.1248687
Becker, Matthias. / Modeling and simulation of a complete semiconductor manufacturing facility using Petri nets. EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696). 2003. pp. 153-156 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA).
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