Model-based resolution enhancement of a miniaturized ion mobility spectrometer

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  • Drägerwerk AG & co. KG
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Details

Original languageEnglish
Title of host publication2008 IEEE Sensors
Pages180-183
Number of pages4
ISBN (electronic)9781424425815
Publication statusPublished - 16 Dec 2008
Externally publishedYes
EventIEEE Sensors 2008 - Lecce, Italy
Duration: 26 Oct 200829 Oct 2009
https://ieee-sensors.org/event/ieee-sensors-2008/

Publication series

NameProceedings of IEEE Sensors
ISSN (Print)1930-0395
ISSN (electronic)2168-9229

Abstract

A numerical model has been used to study the effect of various design parameters on the resolution of our miniaturized ion mobility spectrometer (IMS). This multiphysics model is based on a finite element approach and gives a detailed insight into the convection and migration of gaseous ions in the spectrometer. It can be also applied to other aspiration condenser type IMS. As reported earlier, physical ion-ion and ion-molecule interactions are considered to achieve an adequate accuracy of the simulations. With good conformity between simulations and measurements, both resolution and simplicity of our design could be significantly improved. The optimized IMS can be used in cost and sizelimited applications where chemical substances have to be identified at low ppb-level concentrations within seconds.

ASJC Scopus subject areas

Cite this

Model-based resolution enhancement of a miniaturized ion mobility spectrometer. / Barth, Sebastian; Baether, Wolfgang; Zimmermann, Stefan.
2008 IEEE Sensors. 2008. p. 180-183 (Proceedings of IEEE Sensors).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Barth, S, Baether, W & Zimmermann, S 2008, Model-based resolution enhancement of a miniaturized ion mobility spectrometer. in 2008 IEEE Sensors. Proceedings of IEEE Sensors, pp. 180-183, IEEE Sensors 2008, Lecce, Italy, 26 Oct 2008. https://doi.org/10.1109/ICSENS.2008.4716413
Barth, S., Baether, W., & Zimmermann, S. (2008). Model-based resolution enhancement of a miniaturized ion mobility spectrometer. In 2008 IEEE Sensors (pp. 180-183). (Proceedings of IEEE Sensors). https://doi.org/10.1109/ICSENS.2008.4716413
Barth S, Baether W, Zimmermann S. Model-based resolution enhancement of a miniaturized ion mobility spectrometer. In 2008 IEEE Sensors. 2008. p. 180-183. (Proceedings of IEEE Sensors). doi: 10.1109/ICSENS.2008.4716413
Barth, Sebastian ; Baether, Wolfgang ; Zimmermann, Stefan. / Model-based resolution enhancement of a miniaturized ion mobility spectrometer. 2008 IEEE Sensors. 2008. pp. 180-183 (Proceedings of IEEE Sensors).
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