Methodology for Observation and Evaluation of Fault Tolerance Implementations inside High Temperature ASICs

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Original languageEnglish
Title of host publication ICT.OPEN Conference
Publication statusPublished - 2013
EventICT.OPEN 2013 - Eidhoven, Netherlands
Duration: 27 Nov 201328 Nov 2013

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Methodology for Observation and Evaluation of Fault Tolerance Implementations inside High Temperature ASICs. / Nowosielski, Rochus; Gerlach, Lukas Konrad; Payá Vayá, Guillermo et al.
ICT.OPEN Conference. 2013.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Nowosielski R, Gerlach LK, Payá Vayá G, Hesselbarth S, Blume HC. Methodology for Observation and Evaluation of Fault Tolerance Implementations inside High Temperature ASICs. In ICT.OPEN Conference. 2013
Nowosielski, Rochus ; Gerlach, Lukas Konrad ; Payá Vayá, Guillermo et al. / Methodology for Observation and Evaluation of Fault Tolerance Implementations inside High Temperature ASICs. ICT.OPEN Conference. 2013.
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title = "Methodology for Observation and Evaluation of Fault Tolerance Implementations inside High Temperature ASICs",
author = "Rochus Nowosielski and Gerlach, {Lukas Konrad} and {Pay{\'a} Vay{\'a}}, Guillermo and Sebastian Hesselbarth and Blume, {Holger Christoph}",
year = "2013",
language = "English",
booktitle = "ICT.OPEN Conference",
note = "ICT.OPEN 2013 ; Conference date: 27-11-2013 Through 28-11-2013",

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TY - GEN

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AU - Nowosielski, Rochus

AU - Gerlach, Lukas Konrad

AU - Payá Vayá, Guillermo

AU - Hesselbarth, Sebastian

AU - Blume, Holger Christoph

PY - 2013

Y1 - 2013

M3 - Conference contribution

BT - ICT.OPEN Conference

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Y2 - 27 November 2013 through 28 November 2013

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