Details
Original language | English |
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Title of host publication | ICT.OPEN Conference |
Publication status | Published - 2013 |
Event | ICT.OPEN 2013 - Eidhoven, Netherlands Duration: 27 Nov 2013 → 28 Nov 2013 |
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ICT.OPEN Conference. 2013.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Methodology for Observation and Evaluation of Fault Tolerance Implementations inside High Temperature ASICs
AU - Nowosielski, Rochus
AU - Gerlach, Lukas Konrad
AU - Payá Vayá, Guillermo
AU - Hesselbarth, Sebastian
AU - Blume, Holger Christoph
PY - 2013
Y1 - 2013
M3 - Conference contribution
BT - ICT.OPEN Conference
T2 - ICT.OPEN 2013
Y2 - 27 November 2013 through 28 November 2013
ER -