Details
| Original language | English |
|---|---|
| Title of host publication | 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (electronic) | 9781538606896 |
| Publication status | Published - 2 Nov 2017 |
| Event | 2017 International Symposium on Electromagnetic Compatibility: EMC Europe 2017 - Angers, France Duration: 4 Sept 2017 → 8 Sept 2017 |
Abstract
Modern electronic systems with a high degree of interconnectivity are prone to intentional and unintentional electromagnetic interference (IEMI/EMI). Therefore, emission and immunity measurements of all parts of a system are essential in order to prevent system failures or even breakdowns. Some of these IEMI measurements, especially the high-altitude electromagnetic pulse (HEMP) immunity tests are well described for transverse electromagnetic (TEM) cells in [1]. It has to be validated that the supplied transient pulses and the resulting E-field distributions are correctly transmitted by the TEM cell. The validation can be done under minimal effort and for any transient signal waveform with the knowledge of the transfer function of a TEM waveguide. This paper provides a measurement approach based on a wide band pulse performance in time domain.
Keywords
- EMC, Immunity measurement, Tem waveguide, Transfer function
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Instrumentation
- Physics and Astronomy(all)
- Radiation
- Computer Science(all)
- Computer Networks and Communications
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 8094640.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Measuring the transfer function of a TEM waveguide
AU - Briest, Niklas
AU - Garbe, Heyno
AU - Schaarschmidt, Martin
N1 - Publisher Copyright: © 2017 IEEE. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2017/11/2
Y1 - 2017/11/2
N2 - Modern electronic systems with a high degree of interconnectivity are prone to intentional and unintentional electromagnetic interference (IEMI/EMI). Therefore, emission and immunity measurements of all parts of a system are essential in order to prevent system failures or even breakdowns. Some of these IEMI measurements, especially the high-altitude electromagnetic pulse (HEMP) immunity tests are well described for transverse electromagnetic (TEM) cells in [1]. It has to be validated that the supplied transient pulses and the resulting E-field distributions are correctly transmitted by the TEM cell. The validation can be done under minimal effort and for any transient signal waveform with the knowledge of the transfer function of a TEM waveguide. This paper provides a measurement approach based on a wide band pulse performance in time domain.
AB - Modern electronic systems with a high degree of interconnectivity are prone to intentional and unintentional electromagnetic interference (IEMI/EMI). Therefore, emission and immunity measurements of all parts of a system are essential in order to prevent system failures or even breakdowns. Some of these IEMI measurements, especially the high-altitude electromagnetic pulse (HEMP) immunity tests are well described for transverse electromagnetic (TEM) cells in [1]. It has to be validated that the supplied transient pulses and the resulting E-field distributions are correctly transmitted by the TEM cell. The validation can be done under minimal effort and for any transient signal waveform with the knowledge of the transfer function of a TEM waveguide. This paper provides a measurement approach based on a wide band pulse performance in time domain.
KW - EMC
KW - Immunity measurement
KW - Tem waveguide
KW - Transfer function
UR - http://www.scopus.com/inward/record.url?scp=85040617133&partnerID=8YFLogxK
U2 - 10.1109/EMCEurope.2017.8094640
DO - 10.1109/EMCEurope.2017.8094640
M3 - Conference contribution
AN - SCOPUS:85040617133
BT - 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 International Symposium on Electromagnetic Compatibility
Y2 - 4 September 2017 through 8 September 2017
ER -