Details
| Original language | English |
|---|---|
| Title of host publication | 50th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials 2018 |
| Publisher | SPIE |
| ISBN (electronic) | 9781510621930 |
| Publication status | Published - 20 Nov 2018 |
| Event | 50th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials 2018 - Boulder, United States Duration: 23 Sept 2018 → 26 Sept 2018 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 10805 |
| ISSN (Print) | 0277-786X |
| ISSN (electronic) | 1996-756X |
Abstract
The exploitation of nonlinear effects in multi-layer thin films allows for optics with novel functions, such as all-optical switching and frequency conversion. In this contribution, an improved interferometric setup for the measurement of the nonlinear refractive index in dielectric substrates and deposited single layers is presented. The setup is based on the wave front deformation caused by the self-focusing in the measured samples. Additionally, measurement results for a highly nonlinear material, indium-Tin-oxide (ITO) are presented with respect to the materials power handling capabilities and compared to values from other materials.
Keywords
- Kerr-effect, Material science, Nonlinear optics, Self-focusing, Thin films
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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50th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials 2018. SPIE, 2018. 1080524 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10805).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Measurement setup for the determination of the nonlinear refractive index of thin films with high nonlinearity
AU - Steinecke, Morten
AU - Kellermann, Tarik
AU - Jupé, Marco
AU - Ristau, Detlev
AU - Jensen, Lars
N1 - Funding information: The authors thank the German Federal Ministry of Education and Research (BMBF) for the financial support of the research projects “Kerr-Band-Schalter” (contract no. 13N13967) and the project “THG-Schicht” (contract no. 13N14063).
PY - 2018/11/20
Y1 - 2018/11/20
N2 - The exploitation of nonlinear effects in multi-layer thin films allows for optics with novel functions, such as all-optical switching and frequency conversion. In this contribution, an improved interferometric setup for the measurement of the nonlinear refractive index in dielectric substrates and deposited single layers is presented. The setup is based on the wave front deformation caused by the self-focusing in the measured samples. Additionally, measurement results for a highly nonlinear material, indium-Tin-oxide (ITO) are presented with respect to the materials power handling capabilities and compared to values from other materials.
AB - The exploitation of nonlinear effects in multi-layer thin films allows for optics with novel functions, such as all-optical switching and frequency conversion. In this contribution, an improved interferometric setup for the measurement of the nonlinear refractive index in dielectric substrates and deposited single layers is presented. The setup is based on the wave front deformation caused by the self-focusing in the measured samples. Additionally, measurement results for a highly nonlinear material, indium-Tin-oxide (ITO) are presented with respect to the materials power handling capabilities and compared to values from other materials.
KW - Kerr-effect
KW - Material science
KW - Nonlinear optics
KW - Self-focusing
KW - Thin films
UR - http://www.scopus.com/inward/record.url?scp=85061060975&partnerID=8YFLogxK
U2 - 10.1117/12.2500341
DO - 10.1117/12.2500341
M3 - Conference contribution
AN - SCOPUS:85061060975
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 50th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials 2018
PB - SPIE
T2 - 50th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials 2018
Y2 - 23 September 2018 through 26 September 2018
ER -