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Magnetic microstructure analysis of sputter deposited permalloy thin films on a spin-on polyimide substrate

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Johannes Rittinger
  • Piriya Taptimthong
  • Lisa Jogschies
  • Marc C. Wurz
  • Lutz Rissing

Details

Original languageEnglish
Pages (from-to)1627-1632
Number of pages6
JournalMicrosystem Technologies
Volume22
Issue number7
Early online date9 Jan 2016
Publication statusPublished - Jul 2016

Abstract

We have performed magneto-optical measurements of sputter deposited permalloy (NiFe 81/19) thin films on a polyimide based spin-on substrate and a silicon oxide substrate. Experiments were performed by means of the magneto-optic Kerr effect in order to complement the findings concerning soft magnetic behaviour on the macroscopic scale presented previously (Rittinger et al., Impact of different polyimide-based substrates on the soft magnetic properties of NiFe thin films, SPIE Microtechnologies. International Society for Optics and Photonics, Bellingham, pp 95171R, 2015) with new insights into the magnetic domain structures of such samples. First, magnetization curves (R–H-, B–H-curves) are compared with corresponding magneto-optical hystereses. Second, by taking into consideration the results of the magnetic microstructure analysis, further aspects of the interactions between the substrate and the functional thin film are revealed in form of analogies between observations on the microscopic scale and variations of macroscopic magnetization curves of analysed samples. Furthermore, the shape and detailed spatial arrangement of domains and their boundaries are determined for the investigated samples, supplying further information on the properties and state of stress of the thin films. Doing so, we aim to provide precise and reliable anisotropic magnetoresistive (AMR) sensors on flexible polymer substrates in the future.

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Magnetic microstructure analysis of sputter deposited permalloy thin films on a spin-on polyimide substrate. / Rittinger, Johannes; Taptimthong, Piriya; Jogschies, Lisa et al.
In: Microsystem Technologies, Vol. 22, No. 7, 07.2016, p. 1627-1632.

Research output: Contribution to journalArticleResearchpeer review

Rittinger J, Taptimthong P, Jogschies L, Wurz MC, Rissing L. Magnetic microstructure analysis of sputter deposited permalloy thin films on a spin-on polyimide substrate. Microsystem Technologies. 2016 Jul;22(7):1627-1632. Epub 2016 Jan 9. doi: 10.1007/s00542-015-2792-0
Rittinger, Johannes ; Taptimthong, Piriya ; Jogschies, Lisa et al. / Magnetic microstructure analysis of sputter deposited permalloy thin films on a spin-on polyimide substrate. In: Microsystem Technologies. 2016 ; Vol. 22, No. 7. pp. 1627-1632.
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abstract = "We have performed magneto-optical measurements of sputter deposited permalloy (NiFe 81/19) thin films on a polyimide based spin-on substrate and a silicon oxide substrate. Experiments were performed by means of the magneto-optic Kerr effect in order to complement the findings concerning soft magnetic behaviour on the macroscopic scale presented previously (Rittinger et al., Impact of different polyimide-based substrates on the soft magnetic properties of NiFe thin films, SPIE Microtechnologies. International Society for Optics and Photonics, Bellingham, pp 95171R, 2015) with new insights into the magnetic domain structures of such samples. First, magnetization curves (R–H-, B–H-curves) are compared with corresponding magneto-optical hystereses. Second, by taking into consideration the results of the magnetic microstructure analysis, further aspects of the interactions between the substrate and the functional thin film are revealed in form of analogies between observations on the microscopic scale and variations of macroscopic magnetization curves of analysed samples. Furthermore, the shape and detailed spatial arrangement of domains and their boundaries are determined for the investigated samples, supplying further information on the properties and state of stress of the thin films. Doing so, we aim to provide precise and reliable anisotropic magnetoresistive (AMR) sensors on flexible polymer substrates in the future.",
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