Details
| Original language | English |
|---|---|
| Article number | 033106 |
| Journal | Journal of applied physics |
| Volume | 104 |
| Issue number | 3 |
| Early online date | 4 Aug 2008 |
| Publication status | Published - 2008 |
| Externally published | Yes |
Abstract
The scattering coefficient and the refractive index of sintered porous silicon are deduced from measurements on 1-4 μm thick freestanding films. Mie's theory is applied to describe the light scattering by the spherical pores. Using a reduced effective refractive index for the host medium in Mie's theory accounts for the close spacing of the pores and results in an agreement between the measured and calculated scattering coefficients. A coherent calculation for the specular nonscattered radiation is combined with a model that describes the propagation of the scattered diffuse light flux. For this diffuse model two approaches, the Kubelka Munk theory and a Lambertian model developed in this work, are compared. The combined model reproduces both, the specular as well as the diffuse component of the measured reflection and transmission.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- General Physics and Astronomy
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In: Journal of applied physics, Vol. 104, No. 3, 033106, 2008.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Light scattering and diffuse light propagation in sintered porous silicon
AU - Wolf, A.
AU - Terheiden, B.
AU - Brendel, R.
N1 - Funding Information: We gratefully acknowledge fruitful discussions with Wolfgang Theiss (W. Theiss Hard- and Software) and Pietro Altermatt (ISFH). This work is supported by the German Federal Ministry of Environment, Nature Conversation, and Nuclear Safety under Contract No. 0329816E.
PY - 2008
Y1 - 2008
N2 - The scattering coefficient and the refractive index of sintered porous silicon are deduced from measurements on 1-4 μm thick freestanding films. Mie's theory is applied to describe the light scattering by the spherical pores. Using a reduced effective refractive index for the host medium in Mie's theory accounts for the close spacing of the pores and results in an agreement between the measured and calculated scattering coefficients. A coherent calculation for the specular nonscattered radiation is combined with a model that describes the propagation of the scattered diffuse light flux. For this diffuse model two approaches, the Kubelka Munk theory and a Lambertian model developed in this work, are compared. The combined model reproduces both, the specular as well as the diffuse component of the measured reflection and transmission.
AB - The scattering coefficient and the refractive index of sintered porous silicon are deduced from measurements on 1-4 μm thick freestanding films. Mie's theory is applied to describe the light scattering by the spherical pores. Using a reduced effective refractive index for the host medium in Mie's theory accounts for the close spacing of the pores and results in an agreement between the measured and calculated scattering coefficients. A coherent calculation for the specular nonscattered radiation is combined with a model that describes the propagation of the scattered diffuse light flux. For this diffuse model two approaches, the Kubelka Munk theory and a Lambertian model developed in this work, are compared. The combined model reproduces both, the specular as well as the diffuse component of the measured reflection and transmission.
UR - http://www.scopus.com/inward/record.url?scp=49749096108&partnerID=8YFLogxK
U2 - 10.1063/1.2956690
DO - 10.1063/1.2956690
M3 - Article
AN - SCOPUS:49749096108
VL - 104
JO - Journal of applied physics
JF - Journal of applied physics
SN - 0021-8979
IS - 3
M1 - 033106
ER -