Light and elevated Temperature Induced Degradation (LeTID) of the Carrier Lifetime in Multicrystalline Silicon

Research output: ThesisDoctoral thesis

Authors

  • Dennis Bredemeier

Research Organisations

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Details

Original languageEnglish
QualificationDoctor rerum naturalium
Awarding Institution
Supervised by
Date of Award13 Mar 2020
Place of PublicationHannover
Publication statusPublished - 2020

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Light and elevated Temperature Induced Degradation (LeTID) of the Carrier Lifetime in Multicrystalline Silicon. / Bredemeier, Dennis.
Hannover, 2020. 119 p.

Research output: ThesisDoctoral thesis

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@phdthesis{57e22dfd719d44f9abbd2660f26d1d09,
title = "Light and elevated Temperature Induced Degradation (LeTID) of the Carrier Lifetime in Multicrystalline Silicon",
author = "Dennis Bredemeier",
note = "Doctoral thesis",
year = "2020",
doi = "10.15488/9814",
language = "English",
school = "Leibniz University Hannover",

}

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TY - BOOK

T1 - Light and elevated Temperature Induced Degradation (LeTID) of the Carrier Lifetime in Multicrystalline Silicon

AU - Bredemeier, Dennis

N1 - Doctoral thesis

PY - 2020

Y1 - 2020

U2 - 10.15488/9814

DO - 10.15488/9814

M3 - Doctoral thesis

CY - Hannover

ER -

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