Laser damage threshold of MgF2 thin films by photoacoustic beam deflection

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Authors

  • Maria Lucia Protopapa
  • Maria Rita Perrone
  • Angela Piegari
  • Enrico Masetti
  • Detlev Ristau
  • Etienne Quesnel
  • Angela Duparre

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
  • Fraunhofer Institute for Applied Optics and Precision Engineering (IOF)
  • CEA-LETI
  • ENEA-Cassacia
  • University of Salento
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Details

Original languageEnglish
Title of host publicationLaser-Induced Damage in Optical Materials: 1999
Subtitle of host publication4 - 7 October 1999, Boulder, Colorado ; proceedings
Place of PublicationBellingham
PublisherSPIE
Pages175-181
Number of pages7
ISBN (print)0-8194-3508-2
Publication statusPublished - 3 Mar 2000
Externally publishedYes
Event31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999' - Boulder, CO, USA
Duration: 4 Oct 1999 → 7 Oct 1999

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume3902
ISSN (Print)0277-786X

Abstract

The photoacoustic beam deflection technique at λ = 248 nm was employed for the measurement of the laser damage threshold of single films of magnesium fluoride deposited on superpolished calcium fluoride and fused silica substrates. Different samples were investigated. All films have similar thickness but are deposited by various techniques (ion-beam sputtering, boat and e-beam thermal evaporation) in different laboratories. The samples are fully characterized, both from the optical and the structural point of view, in the framework of a European Project on `UV-Coatings'. The results of these measurements are reported, along with the data on laser damage threshold, to find out which are the most significant parameters for laser applications.

ASJC Scopus subject areas

Cite this

Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. / Protopapa, Maria Lucia; Perrone, Maria Rita; Piegari, Angela et al.
Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE, 2000. p. 175-181 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3902).

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Protopapa, ML, Perrone, MR, Piegari, A, Masetti, E, Ristau, D, Quesnel, E & Duparre, A 2000, Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. in Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Proceedings of SPIE - The International Society for Optical Engineering, vol. 3902, SPIE, Bellingham, pp. 175-181, 31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999', Boulder, CO, USA, 4 Oct 1999. https://doi.org/10.1117/12.379303
Protopapa, M. L., Perrone, M. R., Piegari, A., Masetti, E., Ristau, D., Quesnel, E., & Duparre, A. (2000). Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. In Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings (pp. 175-181). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3902). SPIE. https://doi.org/10.1117/12.379303
Protopapa ML, Perrone MR, Piegari A, Masetti E, Ristau D, Quesnel E et al. Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. In Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE. 2000. p. 175-181. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.379303
Protopapa, Maria Lucia ; Perrone, Maria Rita ; Piegari, Angela et al. / Laser damage threshold of MgF2 thin films by photoacoustic beam deflection. Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham : SPIE, 2000. pp. 175-181 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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