Details
| Original language | English |
|---|---|
| Pages (from-to) | 235-238 |
| Number of pages | 4 |
| Journal | Physica Status Solidi - Rapid Research Letters |
| Volume | 8 |
| Issue number | 3 |
| Early online date | 7 Jan 2014 |
| Publication status | Published - 14 Mar 2014 |
Abstract
Lambertian light trapping is a benchmark for efficient light trapping. In this Letter we experimentally quantify the degree of Lambertian light trapping in a macroporous silicon layer. The optical absorption of the effective (26.7 ± 5.5) μm thick sample with randomly arranged pores yields a photogeneration corresponding to a maximum current density of (40.8 ± 0.4) mA cm-2 and thus achieves a fraction of 0.985 ± 0.012 of the current density expected from a Lambertian light trapping scheme. The measured spectrum of the escape reflectance is well described with an analytic model assuming a complete randomization of the directions of light propagation.
Keywords
- Crystals, Light trapping, Porous materials, Silicon, Thin films
ASJC Scopus subject areas
- Materials Science(all)
- General Materials Science
- Physics and Astronomy(all)
- Condensed Matter Physics
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In: Physica Status Solidi - Rapid Research Letters, Vol. 8, No. 3, 14.03.2014, p. 235-238.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Lambertian light trapping in thin crystalline macroporous Si layers
AU - Ernst, Marco
AU - Brendel, Rolf
PY - 2014/3/14
Y1 - 2014/3/14
N2 - Lambertian light trapping is a benchmark for efficient light trapping. In this Letter we experimentally quantify the degree of Lambertian light trapping in a macroporous silicon layer. The optical absorption of the effective (26.7 ± 5.5) μm thick sample with randomly arranged pores yields a photogeneration corresponding to a maximum current density of (40.8 ± 0.4) mA cm-2 and thus achieves a fraction of 0.985 ± 0.012 of the current density expected from a Lambertian light trapping scheme. The measured spectrum of the escape reflectance is well described with an analytic model assuming a complete randomization of the directions of light propagation.
AB - Lambertian light trapping is a benchmark for efficient light trapping. In this Letter we experimentally quantify the degree of Lambertian light trapping in a macroporous silicon layer. The optical absorption of the effective (26.7 ± 5.5) μm thick sample with randomly arranged pores yields a photogeneration corresponding to a maximum current density of (40.8 ± 0.4) mA cm-2 and thus achieves a fraction of 0.985 ± 0.012 of the current density expected from a Lambertian light trapping scheme. The measured spectrum of the escape reflectance is well described with an analytic model assuming a complete randomization of the directions of light propagation.
KW - Crystals
KW - Light trapping
KW - Porous materials
KW - Silicon
KW - Thin films
UR - http://www.scopus.com/inward/record.url?scp=84896031947&partnerID=8YFLogxK
U2 - 10.1002/pssr.201308294
DO - 10.1002/pssr.201308294
M3 - Article
AN - SCOPUS:84896031947
VL - 8
SP - 235
EP - 238
JO - Physica Status Solidi - Rapid Research Letters
JF - Physica Status Solidi - Rapid Research Letters
SN - 1862-6254
IS - 3
ER -