Details
| Original language | English |
|---|---|
| Pages (from-to) | 3227-3240 |
| Number of pages | 14 |
| Journal | Journal of materials research |
| Volume | 30 |
| Issue number | 21 |
| Early online date | 1 Nov 2015 |
| Publication status | Published - Nov 2015 |
Abstract
We report on a kerfless exfoliation approach to further reduce the costs of crystalline silicon photovoltaics making use of evaporated Al as a double functional layer. The Al serves as the stress inducing element to drive the exfoliation process and can be maintained as a rear contacting layer in the solar cell after exfoliation. The 50-70 μm thick exfoliated Si layers show effective minority carrier lifetimes around 180 μs with diffusion lengths of 10 times the layer thickness. We analyze the thermo-mechanical properties of the Al layer by x-ray diffraction analysis and investigate its influence on the exfoliation process. We evaluate the approach for the implementation into solar cell production by determining processing limits and estimating cost advantages of a possible solar cell design route. The Al-Si bilayers are mechanically stable under processing conditions and exhibit a moderate cost savings potential of 3-36% compared to other c-Si cell concepts.
Keywords
- Si, thermal stresses, x-ray diffraction (XRD)
ASJC Scopus subject areas
- Materials Science(all)
- General Materials Science
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Mechanics of Materials
- Engineering(all)
- Mechanical Engineering
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In: Journal of materials research, Vol. 30, No. 21, 11.2015, p. 3227-3240.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Kerfless exfoliated thin crystalline Si wafers with Al metallization layers for solar cells
AU - Niepelt, Raphael
AU - Hensen, Jan
AU - Steckenreiter, Verena
AU - Brendel, Rolf
AU - Kajari-Schöder, Sarah
PY - 2015/11
Y1 - 2015/11
N2 - We report on a kerfless exfoliation approach to further reduce the costs of crystalline silicon photovoltaics making use of evaporated Al as a double functional layer. The Al serves as the stress inducing element to drive the exfoliation process and can be maintained as a rear contacting layer in the solar cell after exfoliation. The 50-70 μm thick exfoliated Si layers show effective minority carrier lifetimes around 180 μs with diffusion lengths of 10 times the layer thickness. We analyze the thermo-mechanical properties of the Al layer by x-ray diffraction analysis and investigate its influence on the exfoliation process. We evaluate the approach for the implementation into solar cell production by determining processing limits and estimating cost advantages of a possible solar cell design route. The Al-Si bilayers are mechanically stable under processing conditions and exhibit a moderate cost savings potential of 3-36% compared to other c-Si cell concepts.
AB - We report on a kerfless exfoliation approach to further reduce the costs of crystalline silicon photovoltaics making use of evaporated Al as a double functional layer. The Al serves as the stress inducing element to drive the exfoliation process and can be maintained as a rear contacting layer in the solar cell after exfoliation. The 50-70 μm thick exfoliated Si layers show effective minority carrier lifetimes around 180 μs with diffusion lengths of 10 times the layer thickness. We analyze the thermo-mechanical properties of the Al layer by x-ray diffraction analysis and investigate its influence on the exfoliation process. We evaluate the approach for the implementation into solar cell production by determining processing limits and estimating cost advantages of a possible solar cell design route. The Al-Si bilayers are mechanically stable under processing conditions and exhibit a moderate cost savings potential of 3-36% compared to other c-Si cell concepts.
KW - Si
KW - thermal stresses
KW - x-ray diffraction (XRD)
UR - http://www.scopus.com/inward/record.url?scp=84949256677&partnerID=8YFLogxK
U2 - 10.1557/jmr.2015.309
DO - 10.1557/jmr.2015.309
M3 - Article
AN - SCOPUS:84949256677
VL - 30
SP - 3227
EP - 3240
JO - Journal of materials research
JF - Journal of materials research
SN - 0884-2914
IS - 21
ER -