Details
| Original language | English |
|---|---|
| Pages (from-to) | 537-541 |
| Number of pages | 5 |
| Journal | Talanta |
| Volume | 185 |
| Publication status | Published - 10 Apr 2018 |
Abstract
Ion mobility spectrometers (IMS) are compact devices for extremely sensitive detection of proton and electron affine volatile compounds down to low pptv concentrations within less than a second. The measuring principle requires ionization of the target analyte. Most IMS employ radioactive electron sources, such as 63Ni or 3H. These radioactive materials suffer from legal restrictions limiting the fields of application. Furthermore, the electron emission has a predetermined intensity and cannot be controlled or disabled. In a previous work, we replaced the axially mounted 3H source of our ion mobility spectrometer with a commercially available X-ray source operated at low acceleration voltage of 4.5 kV to be applicable in most application without legal restrictions. However, the high penetration depth of the radiation together with the statistical behavior of the X-ray ionization process led to an increase of Fano noise and thus a limited signal-to-noise ratio. Therefore, the X-ray source is now mounted orthogonal to the drift tube in order to avoid Fano noise. Here, we compare the analytical performance of this orthogonal setup with the axially mounted X-ray source. The noise level is significantly reduced. This improves the signal-to-noise ratio from 700 with the axially placed source to more than 3000 with the orthogonally placed source, while the resolving power still remains at R = 100. Furthermore, typical limits of detection for some model substances in the low pptv range in positive and negative ion mode are given.
Keywords
- Ion Mobility Spectrometry, Non-radioactive ionization source, Orthogonal X-ray source, X-ray IMS, X-ray ionization
ASJC Scopus subject areas
- Chemistry(all)
- Analytical Chemistry
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In: Talanta, Vol. 185, 10.04.2018, p. 537-541.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Ion mobility spectrometer with orthogonal X-Ray source for increased sensitivity
AU - Bunert, Erik
AU - Reinecke, Tobias
AU - Kirk, Ansgar T.
AU - Bohnhorst, Alexander
AU - Zimmermann, Stefan
PY - 2018/4/10
Y1 - 2018/4/10
N2 - Ion mobility spectrometers (IMS) are compact devices for extremely sensitive detection of proton and electron affine volatile compounds down to low pptv concentrations within less than a second. The measuring principle requires ionization of the target analyte. Most IMS employ radioactive electron sources, such as 63Ni or 3H. These radioactive materials suffer from legal restrictions limiting the fields of application. Furthermore, the electron emission has a predetermined intensity and cannot be controlled or disabled. In a previous work, we replaced the axially mounted 3H source of our ion mobility spectrometer with a commercially available X-ray source operated at low acceleration voltage of 4.5 kV to be applicable in most application without legal restrictions. However, the high penetration depth of the radiation together with the statistical behavior of the X-ray ionization process led to an increase of Fano noise and thus a limited signal-to-noise ratio. Therefore, the X-ray source is now mounted orthogonal to the drift tube in order to avoid Fano noise. Here, we compare the analytical performance of this orthogonal setup with the axially mounted X-ray source. The noise level is significantly reduced. This improves the signal-to-noise ratio from 700 with the axially placed source to more than 3000 with the orthogonally placed source, while the resolving power still remains at R = 100. Furthermore, typical limits of detection for some model substances in the low pptv range in positive and negative ion mode are given.
AB - Ion mobility spectrometers (IMS) are compact devices for extremely sensitive detection of proton and electron affine volatile compounds down to low pptv concentrations within less than a second. The measuring principle requires ionization of the target analyte. Most IMS employ radioactive electron sources, such as 63Ni or 3H. These radioactive materials suffer from legal restrictions limiting the fields of application. Furthermore, the electron emission has a predetermined intensity and cannot be controlled or disabled. In a previous work, we replaced the axially mounted 3H source of our ion mobility spectrometer with a commercially available X-ray source operated at low acceleration voltage of 4.5 kV to be applicable in most application without legal restrictions. However, the high penetration depth of the radiation together with the statistical behavior of the X-ray ionization process led to an increase of Fano noise and thus a limited signal-to-noise ratio. Therefore, the X-ray source is now mounted orthogonal to the drift tube in order to avoid Fano noise. Here, we compare the analytical performance of this orthogonal setup with the axially mounted X-ray source. The noise level is significantly reduced. This improves the signal-to-noise ratio from 700 with the axially placed source to more than 3000 with the orthogonally placed source, while the resolving power still remains at R = 100. Furthermore, typical limits of detection for some model substances in the low pptv range in positive and negative ion mode are given.
KW - Ion Mobility Spectrometry
KW - Non-radioactive ionization source
KW - Orthogonal X-ray source
KW - X-ray IMS
KW - X-ray ionization
UR - http://www.scopus.com/inward/record.url?scp=85045241216&partnerID=8YFLogxK
U2 - 10.15488/4410
DO - 10.15488/4410
M3 - Article
C2 - 29759238
AN - SCOPUS:85045241216
VL - 185
SP - 537
EP - 541
JO - Talanta
JF - Talanta
SN - 0039-9140
ER -