Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

External Research Organisations

  • Institute for Solar Energy Research (ISFH)
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Details

Original languageEnglish
Title of host publication2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings
EditorsVolker Haublein, Heiner Ryssel
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages90-93
Number of pages4
ISBN (electronic)9781538668283
Publication statusPublished - Sept 2018
Event22nd International Conference on Ion Implantation Technology, IIT 2018 - Wurzburg, Germany
Duration: 16 Sept 201821 Sept 2018

Publication series

NameProceedings of the International Conference on Ion Implantation Technology
Volume2018-September

Abstract

We compare the electrical behavior of different dopant species (As, P, B, BF, BF2) on solar-relevant surfaces (alkaline textured and planar). We find significant differences when substituting B by BF or BF2 as well as when using As instead of P. For the latter equivalent recombination behavior is observed, whereas the sheet resistance is higher when using As. The use of F containing p-type species leads to an increase in sheet resistance and saturation current density.

Keywords

    ion implantation, silicon, solar cells

ASJC Scopus subject areas

Sustainable Development Goals

Cite this

Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. / Krügener, Jan; Kiefer, Fabian; Peibst, Robby et al.
2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings. ed. / Volker Haublein; Heiner Ryssel. Institute of Electrical and Electronics Engineers Inc., 2018. p. 90-93 8807962 (Proceedings of the International Conference on Ion Implantation Technology; Vol. 2018-September).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Krügener, J, Kiefer, F, Peibst, R & Osten, HJ 2018, Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. in V Haublein & H Ryssel (eds), 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings., 8807962, Proceedings of the International Conference on Ion Implantation Technology, vol. 2018-September, Institute of Electrical and Electronics Engineers Inc., pp. 90-93, 22nd International Conference on Ion Implantation Technology, IIT 2018, Wurzburg, Germany, 16 Sept 2018. https://doi.org/10.1109/iit.2018.8807962
Krügener, J., Kiefer, F., Peibst, R., & Osten, H. J. (2018). Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. In V. Haublein, & H. Ryssel (Eds.), 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings (pp. 90-93). Article 8807962 (Proceedings of the International Conference on Ion Implantation Technology; Vol. 2018-September). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/iit.2018.8807962
Krügener J, Kiefer F, Peibst R, Osten HJ. Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. In Haublein V, Ryssel H, editors, 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. p. 90-93. 8807962. (Proceedings of the International Conference on Ion Implantation Technology). doi: 10.1109/iit.2018.8807962
Krügener, Jan ; Kiefer, Fabian ; Peibst, Robby et al. / Ion Implantation of As, P, B, BF and BF2 on Planar and Alkaline-Textured Si(001) Surfaces for Photovoltaic Applications. 2018 22nd International Conference on Ion Implantation Technology, IIT 2018 - Proceedings. editor / Volker Haublein ; Heiner Ryssel. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 90-93 (Proceedings of the International Conference on Ion Implantation Technology).
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abstract = "We compare the electrical behavior of different dopant species (As, P, B, BF, BF2) on solar-relevant surfaces (alkaline textured and planar). We find significant differences when substituting B by BF or BF2 as well as when using As instead of P. For the latter equivalent recombination behavior is observed, whereas the sheet resistance is higher when using As. The use of F containing p-type species leads to an increase in sheet resistance and saturation current density.",
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AU - Kiefer, Fabian

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