Details
| Original language | English |
|---|---|
| Title of host publication | 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 706-709 |
| Number of pages | 4 |
| ISBN (electronic) | 978-1-7281-3121-4 |
| ISBN (print) | 978-1-7281-3120-7 |
| Publication status | Published - Oct 2019 |
| Event | 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Richland, United States Duration: 20 Oct 2019 → 23 Oct 2019 |
Publication series
| Name | Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP |
|---|---|
| Volume | 2019-October |
| ISSN (Print) | 0084-9162 |
Abstract
In polymeric insulations space charges tend to form under DC voltage stress. Consequently, at a polarity reversal of the voltage, the electric field is intensified locally, which accelerates the aging of the insulation and can lead to the destruction of the insulating material in the worst case. The aim of this work is to investigate the aging of special layered silicone dielectrics under DC voltage stress. Two-layered silicone samples were made, one layer without fillers and the other made of the same silicone, mixed with a specific amount of conductive additive. Thus, the layers have different electric conductivities, which are dependent on the temperature and the electric field strength. First of all, the life span of the silicone stack under DC was investigated. Since there is no standard, how to accomplish this under DC, the life span was determined according to AC. The aging of the samples was carried out thermally with and without DC voltage stress for 15 weeks. The breakdown test was conducted after every three weeks using a ramp-test.
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Engineering(all)
- Electrical and Electronic Engineering
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2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. p. 706-709 9009661 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; Vol. 2019-October).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Investigation on the Breakdown Strength of Aged Special Layered Silicone Dielectrics under DC Stress
AU - Aganbegovic, Mirnes
AU - Werle, Peter
N1 - Publisher Copyright: © 2019 IEEE. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2019/10
Y1 - 2019/10
N2 - In polymeric insulations space charges tend to form under DC voltage stress. Consequently, at a polarity reversal of the voltage, the electric field is intensified locally, which accelerates the aging of the insulation and can lead to the destruction of the insulating material in the worst case. The aim of this work is to investigate the aging of special layered silicone dielectrics under DC voltage stress. Two-layered silicone samples were made, one layer without fillers and the other made of the same silicone, mixed with a specific amount of conductive additive. Thus, the layers have different electric conductivities, which are dependent on the temperature and the electric field strength. First of all, the life span of the silicone stack under DC was investigated. Since there is no standard, how to accomplish this under DC, the life span was determined according to AC. The aging of the samples was carried out thermally with and without DC voltage stress for 15 weeks. The breakdown test was conducted after every three weeks using a ramp-test.
AB - In polymeric insulations space charges tend to form under DC voltage stress. Consequently, at a polarity reversal of the voltage, the electric field is intensified locally, which accelerates the aging of the insulation and can lead to the destruction of the insulating material in the worst case. The aim of this work is to investigate the aging of special layered silicone dielectrics under DC voltage stress. Two-layered silicone samples were made, one layer without fillers and the other made of the same silicone, mixed with a specific amount of conductive additive. Thus, the layers have different electric conductivities, which are dependent on the temperature and the electric field strength. First of all, the life span of the silicone stack under DC was investigated. Since there is no standard, how to accomplish this under DC, the life span was determined according to AC. The aging of the samples was carried out thermally with and without DC voltage stress for 15 weeks. The breakdown test was conducted after every three weeks using a ramp-test.
UR - http://www.scopus.com/inward/record.url?scp=85081664069&partnerID=8YFLogxK
U2 - 10.1109/CEIDP47102.2019.9009661
DO - 10.1109/CEIDP47102.2019.9009661
M3 - Conference contribution
AN - SCOPUS:85081664069
SN - 978-1-7281-3120-7
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 706
EP - 709
BT - 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2019
Y2 - 20 October 2019 through 23 October 2019
ER -