Investigation of line width narrowing and spectral jumps of single stable defect centers in ZnO at cryogenic temperature

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Oliver Neitzke
  • Anthony Morfa
  • Janik Wolters
  • Andreas W. Schell
  • Günter Kewes
  • Oliver Benson

External Research Organisations

  • Humboldt-Universität zu Berlin (HU Berlin)
  • Freie Universität Berlin (FU Berlin)
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Details

Original languageEnglish
Pages (from-to)3024-3029
Number of pages6
JournalNano letters
Volume15
Issue number5
Publication statusPublished - 13 May 2015
Externally publishedYes

Abstract

Finding new solid state defect centers in novel host materials is crucial for realizing integrated hybrid quantum photonic devices. We present a preparation method for defect centers with photostable bright single photon emission in zinc oxide, a material with promising properties in terms of processability, availability, and applications. A detailed optical study reveals a complex dynamic of intensity fluctuations at room temperature. Measurements at cryogenic temperatures show very sharp (<60 GHz) zero phonon lines (ZPLs) at 580 nm to 620 nm (≈ 2.0 eV) with frozen out fast fluctuations. Remaining discrete jumps of the ZPL, which depend on the excitation power, are observed. The low temperature results will narrow down speculations on the origin of visible-near-infrared (NIR) wavelength defect emission in zinc oxide and provide a basis for improved theoretical models.

Keywords

    cryogenic temperature study, narrow-band emitter, quantum optics, single photon source, ZnO nanomaterial

ASJC Scopus subject areas

Cite this

Investigation of line width narrowing and spectral jumps of single stable defect centers in ZnO at cryogenic temperature. / Neitzke, Oliver; Morfa, Anthony; Wolters, Janik et al.
In: Nano letters, Vol. 15, No. 5, 13.05.2015, p. 3024-3029.

Research output: Contribution to journalArticleResearchpeer review

Neitzke, O, Morfa, A, Wolters, J, Schell, AW, Kewes, G & Benson, O 2015, 'Investigation of line width narrowing and spectral jumps of single stable defect centers in ZnO at cryogenic temperature', Nano letters, vol. 15, no. 5, pp. 3024-3029. https://doi.org/10.1021/nl504941q
Neitzke O, Morfa A, Wolters J, Schell AW, Kewes G, Benson O. Investigation of line width narrowing and spectral jumps of single stable defect centers in ZnO at cryogenic temperature. Nano letters. 2015 May 13;15(5):3024-3029. doi: 10.1021/nl504941q
Neitzke, Oliver ; Morfa, Anthony ; Wolters, Janik et al. / Investigation of line width narrowing and spectral jumps of single stable defect centers in ZnO at cryogenic temperature. In: Nano letters. 2015 ; Vol. 15, No. 5. pp. 3024-3029.
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