Intrinsic stress development and microstructure evolution of Au/Cr/Si multilayer thin films subject to annealing

Research output: Contribution to journalArticleResearchpeer review

Authors

  • David C. Miller
  • Cari F. Herrmann
  • Hans J. Maier
  • Steve M. George
  • Conrad R. Stoldt
  • Ken Gall

External Research Organisations

  • University of Colorado Boulder
  • Paderborn University
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Details

Original languageEnglish
Pages (from-to)873-879
Number of pages7
JournalScripta materialia
Volume52
Issue number9
Publication statusPublished - May 2005
Externally publishedYes

Abstract

Au/Cr/Si microcantilevers were studied in their as-deposited condition and annealed state, with emphasis on a thermal treatment of 225 °C for 24 h. Change in beam curvature was monitored during isothermal hold as a function of time. Secondary grain growth was observed in the gold, which contained non-uniformly distributed twins and dislocation defects. Diffusional transport of the chromium layer was observed during annealing. Nodules arranged in a "rolling hill" topography were observed at the free surface, both before and after annealing. Nanometer thick coatings of alumina grown by atomic layer deposition improved the uniformity of both microstructure evolution and curvature evolution during high-temperature annealing.

Keywords

    Material stability, MEMS, Reliability, Thin metal films

ASJC Scopus subject areas

Cite this

Intrinsic stress development and microstructure evolution of Au/Cr/Si multilayer thin films subject to annealing. / Miller, David C.; Herrmann, Cari F.; Maier, Hans J. et al.
In: Scripta materialia, Vol. 52, No. 9, 05.2005, p. 873-879.

Research output: Contribution to journalArticleResearchpeer review

Miller DC, Herrmann CF, Maier HJ, George SM, Stoldt CR, Gall K. Intrinsic stress development and microstructure evolution of Au/Cr/Si multilayer thin films subject to annealing. Scripta materialia. 2005 May;52(9):873-879. doi: 10.1016/j.scriptamat.2005.01.004
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AU - Maier, Hans J.

AU - George, Steve M.

AU - Stoldt, Conrad R.

AU - Gall, Ken

N1 - Funding Information: The authors would like to acknowledge Nancy Yang and her research group at Sandia National Laboratories for their help with microscopy and further materials characterization. The work is partially supported by a DOE PECASE for KG.

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