Details
| Original language | English |
|---|---|
| Title of host publication | Optical Fabrication and Testing |
| Subtitle of host publication | 26 - 28 May 1999, Berlin, Germany |
| Place of Publication | Bellingham |
| Publisher | SPIE |
| Pages | 548-556 |
| Number of pages | 9 |
| ISBN (print) | 0-8194-3213-X |
| Publication status | Published - 6 Sept 1999 |
| Externally published | Yes |
| Event | 1999 Optical Fabrication and Testing - Berlin, Germany Duration: 26 May 1999 → 28 May 1999 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Publisher | SPIE |
| Volume | 3739 |
| ISSN (Print) | 0277-786X |
Abstract
The measurement of total scatter losses (TSL) is a major prerequisite for the development, optimization and commercialization of high quality optical components. In addition to its influence on laser systems efficiency and beam steering arrangement, TSLs are an important safety aspect for applications of these laser systems. As a consequence, an international standard for TSL measurement in optical components was developed. In the course of technical development and discussion of the standards, called ISO/Draft International Standard 13696 `Test method for radiation scattered by optical components', round robin tests have been conducted to evaluate the procedures involved. The results of these tests are compiled and discussed.
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
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Optical Fabrication and Testing: 26 - 28 May 1999, Berlin, Germany. Bellingham: SPIE, 1999. p. 548-556 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3739).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696
AU - Kadkhoda, Puja
AU - Amra, Claude
AU - Bennett, Jean M.
AU - Deumie, Carole
AU - Duparre, Angela
AU - Gliech, Stefan
AU - Kessler, Helmut
AU - Lauth, Hans
AU - Lindstroem, Tomas
AU - Mueller, A.
AU - Reng, Norbert
AU - Ribbing, Carl Gustaf
AU - Ristau, Detlev
AU - Schuhmann, Ranier
AU - Jolie, Christian
AU - Tilsch, Markus
PY - 1999/9/6
Y1 - 1999/9/6
N2 - The measurement of total scatter losses (TSL) is a major prerequisite for the development, optimization and commercialization of high quality optical components. In addition to its influence on laser systems efficiency and beam steering arrangement, TSLs are an important safety aspect for applications of these laser systems. As a consequence, an international standard for TSL measurement in optical components was developed. In the course of technical development and discussion of the standards, called ISO/Draft International Standard 13696 `Test method for radiation scattered by optical components', round robin tests have been conducted to evaluate the procedures involved. The results of these tests are compiled and discussed.
AB - The measurement of total scatter losses (TSL) is a major prerequisite for the development, optimization and commercialization of high quality optical components. In addition to its influence on laser systems efficiency and beam steering arrangement, TSLs are an important safety aspect for applications of these laser systems. As a consequence, an international standard for TSL measurement in optical components was developed. In the course of technical development and discussion of the standards, called ISO/Draft International Standard 13696 `Test method for radiation scattered by optical components', round robin tests have been conducted to evaluate the procedures involved. The results of these tests are compiled and discussed.
UR - http://www.scopus.com/inward/record.url?scp=0032671839&partnerID=8YFLogxK
U2 - 10.1117/12.360187
DO - 10.1117/12.360187
M3 - Conference contribution
AN - SCOPUS:0032671839
SN - 0-8194-3213-X
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 548
EP - 556
BT - Optical Fabrication and Testing
PB - SPIE
CY - Bellingham
T2 - 1999 Optical Fabrication and Testing
Y2 - 26 May 1999 through 28 May 1999
ER -