In-situ characterization of electron-assisted regeneration of Cz-Si solar cells

Research output: Contribution to journalArticleResearchpeer review

Authors

  • L. Helmich
  • D.C. Walter
  • D. Bredemeier
  • R. Falster
  • V.V. Voronkov
  • Jan Schmidt

Research Organisations

External Research Organisations

  • Institute for Solar Energy Research (ISFH)
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Details

Original languageEnglish
Pages (from-to)283-286
Number of pages4
JournalSolar Energy Materials and Solar Cells
Volume185
Early online date29 May 2018
Publication statusPublished - Oct 2018

Abstract

We examine the regeneration kinetics of passivated emitter and rear solar cells (PERCs) fabricated on boron-doped p-type Czochralski-grown silicon wafers in darkness by electron injection via application of a forward bias voltage at elevated temperature (140 °C) in order to discriminate between electronic and photonic effects. Based on these dark regeneration experiments, we address the existing inconsistency regarding the measured linear dependence of the regeneration rate constant on the excess carrier density. Using the method of dark regeneration by current injection into the solar cell, we are able to measure the total recombination current of the solar cell at the actual regeneration temperature under applied voltage, i.e., at the physically relevant regeneration conditions. The direct comparison of the regeneration rate constant as a function of electronically injected carrier concentration in the dark and the regeneration rate constant during illumination clearly shows that the regeneration is a purely electronically stimulated effect and that photons are not directly involved.

Keywords

    Boron-oxygen defect, Czochralski-grown silicon, LID, Regeneration, Solar cell

ASJC Scopus subject areas

Sustainable Development Goals

Cite this

In-situ characterization of electron-assisted regeneration of Cz-Si solar cells. / Helmich, L.; Walter, D.C.; Bredemeier, D. et al.
In: Solar Energy Materials and Solar Cells, Vol. 185, 10.2018, p. 283-286.

Research output: Contribution to journalArticleResearchpeer review

Helmich L, Walter DC, Bredemeier D, Falster R, Voronkov VV, Schmidt J. In-situ characterization of electron-assisted regeneration of Cz-Si solar cells. Solar Energy Materials and Solar Cells. 2018 Oct;185:283-286. Epub 2018 May 29. doi: 10.1016/j.solmat.2018.05.023
Helmich, L. ; Walter, D.C. ; Bredemeier, D. et al. / In-situ characterization of electron-assisted regeneration of Cz-Si solar cells. In: Solar Energy Materials and Solar Cells. 2018 ; Vol. 185. pp. 283-286.
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@article{0117ab31b77947a5ba98478637ef94d7,
title = "In-situ characterization of electron-assisted regeneration of Cz-Si solar cells",
abstract = "We examine the regeneration kinetics of passivated emitter and rear solar cells (PERCs) fabricated on boron-doped p-type Czochralski-grown silicon wafers in darkness by electron injection via application of a forward bias voltage at elevated temperature (140 °C) in order to discriminate between electronic and photonic effects. Based on these dark regeneration experiments, we address the existing inconsistency regarding the measured linear dependence of the regeneration rate constant on the excess carrier density. Using the method of dark regeneration by current injection into the solar cell, we are able to measure the total recombination current of the solar cell at the actual regeneration temperature under applied voltage, i.e., at the physically relevant regeneration conditions. The direct comparison of the regeneration rate constant as a function of electronically injected carrier concentration in the dark and the regeneration rate constant during illumination clearly shows that the regeneration is a purely electronically stimulated effect and that photons are not directly involved.",
keywords = "Boron-oxygen defect, Czochralski-grown silicon, LID, Regeneration, Solar cell",
author = "L. Helmich and D.C. Walter and D. Bredemeier and R. Falster and V.V. Voronkov and Jan Schmidt",
year = "2018",
month = oct,
doi = "10.1016/j.solmat.2018.05.023",
language = "English",
volume = "185",
pages = "283--286",
journal = "Solar Energy Materials and Solar Cells",
issn = "0927-0248",
publisher = "Elsevier BV",

}

Download

TY - JOUR

T1 - In-situ characterization of electron-assisted regeneration of Cz-Si solar cells

AU - Helmich, L.

AU - Walter, D.C.

AU - Bredemeier, D.

AU - Falster, R.

AU - Voronkov, V.V.

AU - Schmidt, Jan

PY - 2018/10

Y1 - 2018/10

N2 - We examine the regeneration kinetics of passivated emitter and rear solar cells (PERCs) fabricated on boron-doped p-type Czochralski-grown silicon wafers in darkness by electron injection via application of a forward bias voltage at elevated temperature (140 °C) in order to discriminate between electronic and photonic effects. Based on these dark regeneration experiments, we address the existing inconsistency regarding the measured linear dependence of the regeneration rate constant on the excess carrier density. Using the method of dark regeneration by current injection into the solar cell, we are able to measure the total recombination current of the solar cell at the actual regeneration temperature under applied voltage, i.e., at the physically relevant regeneration conditions. The direct comparison of the regeneration rate constant as a function of electronically injected carrier concentration in the dark and the regeneration rate constant during illumination clearly shows that the regeneration is a purely electronically stimulated effect and that photons are not directly involved.

AB - We examine the regeneration kinetics of passivated emitter and rear solar cells (PERCs) fabricated on boron-doped p-type Czochralski-grown silicon wafers in darkness by electron injection via application of a forward bias voltage at elevated temperature (140 °C) in order to discriminate between electronic and photonic effects. Based on these dark regeneration experiments, we address the existing inconsistency regarding the measured linear dependence of the regeneration rate constant on the excess carrier density. Using the method of dark regeneration by current injection into the solar cell, we are able to measure the total recombination current of the solar cell at the actual regeneration temperature under applied voltage, i.e., at the physically relevant regeneration conditions. The direct comparison of the regeneration rate constant as a function of electronically injected carrier concentration in the dark and the regeneration rate constant during illumination clearly shows that the regeneration is a purely electronically stimulated effect and that photons are not directly involved.

KW - Boron-oxygen defect

KW - Czochralski-grown silicon

KW - LID

KW - Regeneration

KW - Solar cell

UR - http://www.scopus.com/inward/record.url?scp=85047429260&partnerID=8YFLogxK

U2 - 10.1016/j.solmat.2018.05.023

DO - 10.1016/j.solmat.2018.05.023

M3 - Article

VL - 185

SP - 283

EP - 286

JO - Solar Energy Materials and Solar Cells

JF - Solar Energy Materials and Solar Cells

SN - 0927-0248

ER -

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