Inner photoelectric effect at Pt/YSZ interface during photoemission electron microscopy

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Arafat Toghan
  • Ronald Imbihl

External Research Organisations

  • South Valley University, Egypt
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Details

Original languageEnglish
Pages (from-to)63-65
Number of pages3
JournalSOLID STATE IONICS
Volume298
Early online date18 Nov 2016
Publication statusPublished - 15 Dec 2016

Abstract

We demonstrate in a photoemission electron microscopy (PEEM) study of Pt/YSZ in vacuum that an open circuit (OC) potential can develop which we attribute to an inner photoelectric effect caused by the irradiation with UV light. The appearance of an OC potential is linked to the existence of a high voltage (HV) of at least 5 kV between sample and PEEM instrument. The OC potential grows with increasing HV reaching about − 200 mV at a HV of 12 kV. The effect represents a potential artefact in PEEM studies of solid ionic conductors with sufficiently small band gap (< 6 eV for photons from D2 discharge lamp).

Keywords

    Open circuit potential, Photoelectric effect, Photoemission electron microscopy, Platinum film electrode, Yttrium stabilized zirconia

ASJC Scopus subject areas

Cite this

Inner photoelectric effect at Pt/YSZ interface during photoemission electron microscopy. / Toghan, Arafat; Imbihl, Ronald.
In: SOLID STATE IONICS, Vol. 298, 15.12.2016, p. 63-65.

Research output: Contribution to journalArticleResearchpeer review

Toghan A, Imbihl R. Inner photoelectric effect at Pt/YSZ interface during photoemission electron microscopy. SOLID STATE IONICS. 2016 Dec 15;298:63-65. Epub 2016 Nov 18. doi: 10.1016/j.ssi.2016.11.005
Toghan, Arafat ; Imbihl, Ronald. / Inner photoelectric effect at Pt/YSZ interface during photoemission electron microscopy. In: SOLID STATE IONICS. 2016 ; Vol. 298. pp. 63-65.
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Download

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AU - Toghan, Arafat

AU - Imbihl, Ronald

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AB - We demonstrate in a photoemission electron microscopy (PEEM) study of Pt/YSZ in vacuum that an open circuit (OC) potential can develop which we attribute to an inner photoelectric effect caused by the irradiation with UV light. The appearance of an OC potential is linked to the existence of a high voltage (HV) of at least 5 kV between sample and PEEM instrument. The OC potential grows with increasing HV reaching about − 200 mV at a HV of 12 kV. The effect represents a potential artefact in PEEM studies of solid ionic conductors with sufficiently small band gap (< 6 eV for photons from D2 discharge lamp).

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