Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Authors

  • Uwe Arz
  • Hartmut Grabinski
  • Dylan F. Williams

Research Organisations

External Research Organisations

  • National Institute of Standards and Technology (NIST)
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Details

Original languageEnglish
Title of host publication54th ARFTG Conference Digest Fall 1999
Subtitle of host publicationAutomatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (electronic)0780356861, 9780780356863
Publication statusPublished - 1999
Event54th Automatic RF Techniques Group, ARFTG Fall 1999 - Atlanta, United States
Duration: 2 Dec 1999 → 3 Dec 1999

Publication series

Name54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999

Abstract

This work investigates the broadband propagation characteristics of transmission lines fabricated on silicon substrates of different conductivities. We compare calculations to measurements and examine the sensitivity of the frequency-dependent line parameters to substrate conductivity.

ASJC Scopus subject areas

Cite this

Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. / Arz, Uwe; Grabinski, Hartmut; Williams, Dylan F.
54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999. Institute of Electrical and Electronics Engineers Inc., 1999. 4120066 (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999).

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Arz, U, Grabinski, H & Williams, DF 1999, Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. in 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999., 4120066, 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999, Institute of Electrical and Electronics Engineers Inc., 54th Automatic RF Techniques Group, ARFTG Fall 1999, Atlanta, United States, 2 Dec 1999. https://doi.org/10.1109/ARFTG.1999.327364
Arz, U., Grabinski, H., & Williams, D. F. (1999). Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. In 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999 Article 4120066 (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ARFTG.1999.327364
Arz U, Grabinski H, Williams DF. Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. In 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999. Institute of Electrical and Electronics Engineers Inc. 1999. 4120066. (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999). doi: 10.1109/ARFTG.1999.327364
Arz, Uwe ; Grabinski, Hartmut ; Williams, Dylan F. / Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines. 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999. Institute of Electrical and Electronics Engineers Inc., 1999. (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999).
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