Details
| Original language | English |
|---|---|
| Title of host publication | 2003 IEEE International Symposium on Electromagnetic Compatibility |
| Subtitle of host publication | EMC ´03 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 1032-1035 |
| Number of pages | 4 |
| ISBN (electronic) | 0780377796 |
| Publication status | Published - 2003 |
| Event | 2003 IEEE International Symposium on Electromagnetic Compatibility, EMC 2003 - Istanbul, Turkey Duration: 11 May 2003 → 16 May 2003 |
Publication series
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| Volume | 2 |
| ISSN (Print) | 1077-4076 |
| ISSN (electronic) | 2158-1118 |
Abstract
This paper deals with the influence of different operation-and program-states on the breakdown effects of electronics by impact of EMP and UWB pulses. Different electronic devices like shift registers, microcontrollers and personal computers were exposed to high amplitude transient pulses.
Keywords
- Electronics, EMP, Susceptibility, UWB
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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2003 IEEE International Symposium on Electromagnetic Compatibility: EMC ´03. Institute of Electrical and Electronics Engineers Inc., 2003. p. 1032-1035 1429090 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Influence of Operation- and Program-States on the Breakdown Effects of Electronics by Impact of EMP and UWB
AU - Camp, Michael
AU - Garbe, Heyno
PY - 2003
Y1 - 2003
N2 - This paper deals with the influence of different operation-and program-states on the breakdown effects of electronics by impact of EMP and UWB pulses. Different electronic devices like shift registers, microcontrollers and personal computers were exposed to high amplitude transient pulses.
AB - This paper deals with the influence of different operation-and program-states on the breakdown effects of electronics by impact of EMP and UWB pulses. Different electronic devices like shift registers, microcontrollers and personal computers were exposed to high amplitude transient pulses.
KW - Electronics
KW - EMP
KW - Susceptibility
KW - UWB
UR - http://www.scopus.com/inward/record.url?scp=57549100266&partnerID=8YFLogxK
U2 - 10.1109/ICSMC2.2003.1429090
DO - 10.1109/ICSMC2.2003.1429090
M3 - Conference contribution
AN - SCOPUS:57549100266
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 1032
EP - 1035
BT - 2003 IEEE International Symposium on Electromagnetic Compatibility
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2003 IEEE International Symposium on Electromagnetic Compatibility, EMC 2003
Y2 - 11 May 2003 through 16 May 2003
ER -