In situ high temperature X-ray diffraction studies of mixed ionic and electronic conducting perovskite-type membranes

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Haihui Wang
  • Cristina Tablet
  • Weishen Yang
  • Jürgen Caro

External Research Organisations

  • CAS - Dalian Institute of Chemical Physics
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Details

Original languageEnglish
Pages (from-to)3750-3755
Number of pages6
JournalMaterials letters
Volume59
Issue number28
Early online date3 Aug 2005
Publication statusPublished - Dec 2005

Abstract

Phase structure and stability of three typical mixed ionic and electronic conducting perovskite-type membranes, SrCo0.8Fe0.2O 3-δ (SCF), Ba0.5Sr0.5Co 0.8Fe0.2O3-δ (BSCF) and BaCo 0.4Fe0.4Zr0.2O3-δ (BCFZ) were studied by in situ high temperature X-ray diffraction at temperatures from 303 to 1273 K and under different atmospheres (air, 2% O2 in Ar and pure Ar) at 1173 K. By analyzing their lattice parameters the thermal expansion coefficients (TECs) of BSCF, SCF and BCZF are obtained to be 11.5 × 10- 6 K- 1, 17.9 × 10- 6 K- 1 and 10.3 × 10- 6 K- 1, respectively. A relationship between phase stability and TEC was proposed: the higher is the TEC, the lower is the operation stability of the perovskite materials.

Keywords

    Membrane, Mixed conductor, Oxygen separation, Perovskite, POM

ASJC Scopus subject areas

Cite this

In situ high temperature X-ray diffraction studies of mixed ionic and electronic conducting perovskite-type membranes. / Wang, Haihui; Tablet, Cristina; Yang, Weishen et al.
In: Materials letters, Vol. 59, No. 28, 12.2005, p. 3750-3755.

Research output: Contribution to journalArticleResearchpeer review

Wang H, Tablet C, Yang W, Caro J. In situ high temperature X-ray diffraction studies of mixed ionic and electronic conducting perovskite-type membranes. Materials letters. 2005 Dec;59(28):3750-3755. Epub 2005 Aug 3. doi: 10.1016/j.matlet.2005.06.067
Wang, Haihui ; Tablet, Cristina ; Yang, Weishen et al. / In situ high temperature X-ray diffraction studies of mixed ionic and electronic conducting perovskite-type membranes. In: Materials letters. 2005 ; Vol. 59, No. 28. pp. 3750-3755.
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abstract = "Phase structure and stability of three typical mixed ionic and electronic conducting perovskite-type membranes, SrCo0.8Fe0.2O 3-δ (SCF), Ba0.5Sr0.5Co 0.8Fe0.2O3-δ (BSCF) and BaCo 0.4Fe0.4Zr0.2O3-δ (BCFZ) were studied by in situ high temperature X-ray diffraction at temperatures from 303 to 1273 K and under different atmospheres (air, 2% O2 in Ar and pure Ar) at 1173 K. By analyzing their lattice parameters the thermal expansion coefficients (TECs) of BSCF, SCF and BCZF are obtained to be 11.5 × 10- 6 K- 1, 17.9 × 10- 6 K- 1 and 10.3 × 10- 6 K- 1, respectively. A relationship between phase stability and TEC was proposed: the higher is the TEC, the lower is the operation stability of the perovskite materials.",
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TY - JOUR

T1 - In situ high temperature X-ray diffraction studies of mixed ionic and electronic conducting perovskite-type membranes

AU - Wang, Haihui

AU - Tablet, Cristina

AU - Yang, Weishen

AU - Caro, Jürgen

PY - 2005/12

Y1 - 2005/12

N2 - Phase structure and stability of three typical mixed ionic and electronic conducting perovskite-type membranes, SrCo0.8Fe0.2O 3-δ (SCF), Ba0.5Sr0.5Co 0.8Fe0.2O3-δ (BSCF) and BaCo 0.4Fe0.4Zr0.2O3-δ (BCFZ) were studied by in situ high temperature X-ray diffraction at temperatures from 303 to 1273 K and under different atmospheres (air, 2% O2 in Ar and pure Ar) at 1173 K. By analyzing their lattice parameters the thermal expansion coefficients (TECs) of BSCF, SCF and BCZF are obtained to be 11.5 × 10- 6 K- 1, 17.9 × 10- 6 K- 1 and 10.3 × 10- 6 K- 1, respectively. A relationship between phase stability and TEC was proposed: the higher is the TEC, the lower is the operation stability of the perovskite materials.

AB - Phase structure and stability of three typical mixed ionic and electronic conducting perovskite-type membranes, SrCo0.8Fe0.2O 3-δ (SCF), Ba0.5Sr0.5Co 0.8Fe0.2O3-δ (BSCF) and BaCo 0.4Fe0.4Zr0.2O3-δ (BCFZ) were studied by in situ high temperature X-ray diffraction at temperatures from 303 to 1273 K and under different atmospheres (air, 2% O2 in Ar and pure Ar) at 1173 K. By analyzing their lattice parameters the thermal expansion coefficients (TECs) of BSCF, SCF and BCZF are obtained to be 11.5 × 10- 6 K- 1, 17.9 × 10- 6 K- 1 and 10.3 × 10- 6 K- 1, respectively. A relationship between phase stability and TEC was proposed: the higher is the TEC, the lower is the operation stability of the perovskite materials.

KW - Membrane

KW - Mixed conductor

KW - Oxygen separation

KW - Perovskite

KW - POM

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