Details
| Original language | English |
|---|---|
| Pages (from-to) | 909-914 |
| Number of pages | 6 |
| Journal | IEEE International Symposium on Electromagnetic Compatibility |
| Volume | 2 |
| Publication status | Published - 2000 |
| Event | 2000 IEEE International Symposium on Electronic Compatibility - Washington, DC, USA Duration: 21 Aug 2000 → 25 Aug 2000 |
Abstract
GTEM cell measurements of a DUT are used to predict the equivalent OATS radiated field. Therefore the DUT is modeled by multipoles. Presently used algorithms include several assumptions in amplitude, phase and position of the multipoles. This paper points out the influence of these assumptions to the simulated OATS field.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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In: IEEE International Symposium on Electromagnetic Compatibility, Vol. 2, 2000, p. 909-914.
Research output: Contribution to journal › Conference article › Research › peer review
}
TY - JOUR
T1 - Improvement of GTEM to OATS correlation
AU - Heidemann, M.
AU - Garbe, H.
PY - 2000
Y1 - 2000
N2 - GTEM cell measurements of a DUT are used to predict the equivalent OATS radiated field. Therefore the DUT is modeled by multipoles. Presently used algorithms include several assumptions in amplitude, phase and position of the multipoles. This paper points out the influence of these assumptions to the simulated OATS field.
AB - GTEM cell measurements of a DUT are used to predict the equivalent OATS radiated field. Therefore the DUT is modeled by multipoles. Presently used algorithms include several assumptions in amplitude, phase and position of the multipoles. This paper points out the influence of these assumptions to the simulated OATS field.
UR - http://www.scopus.com/inward/record.url?scp=0033710685&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0033710685
VL - 2
SP - 909
EP - 914
JO - IEEE International Symposium on Electromagnetic Compatibility
JF - IEEE International Symposium on Electromagnetic Compatibility
SN - 0190-1494
T2 - 2000 IEEE International Symposium on Electronic Compatibility
Y2 - 21 August 2000 through 25 August 2000
ER -