Details
| Original language | English |
|---|---|
| Title of host publication | Emerging Digital Micromirror Device Based Systems and Applications XIII |
| Editors | John Ehmke, Benjamin L. Lee |
| Publisher | SPIE |
| ISBN (electronic) | 9781510642317 |
| Publication status | Published - 2021 |
| Event | Emerging Digital Micromirror Device Based Systems and Applications XIII 2021 - Virtual, Online, United States Duration: 6 Mar 2021 → 11 Mar 2021 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 11698 |
| ISSN (Print) | 0277-786X |
| ISSN (electronic) | 1996-756X |
Abstract
Based the fringe projection profilometry, a compact and flexible positionable measuring head can be combined with optical fiber bundles to perform in-situ inspection tasks in industrial applications. Surfaces of complex geometries can be reconstructed and quantified in metric coordinates by means of a fast, non-contact and high-resolution measurement. Defect segmentation, on the other hand, is rather complex with three-dimensional point clouds, since reference data is required or a deviation determination is ambiguous and susceptible to errors. Due to each reconstructed object point corresponding to a camera pixel, it is possible to apply image processing algorithms or neural networks for defect segmentation. Since image based segmentation is more susceptible to poor illumination and deviating surface curvature or texture, a circular array of miniature LEDs has been coaxially arranged around the imaging optics of the camera's fiber to provide different illumination directions. By utilizing a directional variable illumination sequence, the advantages of image-based segmentation can be combined with the unambiguousness and metric quantifiability of point cloud data.
Keywords
- brighteld illumination, defect segmentation, endoscopy, fringe projection, metrology
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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- Apa
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- BibTeX
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Emerging Digital Micromirror Device Based Systems and Applications XIII. ed. / John Ehmke; Benjamin L. Lee. SPIE, 2021. 116980S (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11698).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Improved defect segmentation by combining fiber optic fringe projection profilometry with directional variable brightfield illumination
AU - Hinz, Lennart
AU - Kästner, Markus
AU - Reithmeier, Eduard
N1 - Funding Information: The authors would like to thank the German Research Foundation (DFG) for funding the project B6 ”Endoscopic geometry inspection” within the Collaborative Research Center (CRC) / TR 73.
PY - 2021
Y1 - 2021
N2 - Based the fringe projection profilometry, a compact and flexible positionable measuring head can be combined with optical fiber bundles to perform in-situ inspection tasks in industrial applications. Surfaces of complex geometries can be reconstructed and quantified in metric coordinates by means of a fast, non-contact and high-resolution measurement. Defect segmentation, on the other hand, is rather complex with three-dimensional point clouds, since reference data is required or a deviation determination is ambiguous and susceptible to errors. Due to each reconstructed object point corresponding to a camera pixel, it is possible to apply image processing algorithms or neural networks for defect segmentation. Since image based segmentation is more susceptible to poor illumination and deviating surface curvature or texture, a circular array of miniature LEDs has been coaxially arranged around the imaging optics of the camera's fiber to provide different illumination directions. By utilizing a directional variable illumination sequence, the advantages of image-based segmentation can be combined with the unambiguousness and metric quantifiability of point cloud data.
AB - Based the fringe projection profilometry, a compact and flexible positionable measuring head can be combined with optical fiber bundles to perform in-situ inspection tasks in industrial applications. Surfaces of complex geometries can be reconstructed and quantified in metric coordinates by means of a fast, non-contact and high-resolution measurement. Defect segmentation, on the other hand, is rather complex with three-dimensional point clouds, since reference data is required or a deviation determination is ambiguous and susceptible to errors. Due to each reconstructed object point corresponding to a camera pixel, it is possible to apply image processing algorithms or neural networks for defect segmentation. Since image based segmentation is more susceptible to poor illumination and deviating surface curvature or texture, a circular array of miniature LEDs has been coaxially arranged around the imaging optics of the camera's fiber to provide different illumination directions. By utilizing a directional variable illumination sequence, the advantages of image-based segmentation can be combined with the unambiguousness and metric quantifiability of point cloud data.
KW - brighteld illumination
KW - defect segmentation
KW - endoscopy
KW - fringe projection
KW - metrology
UR - http://www.scopus.com/inward/record.url?scp=85107447739&partnerID=8YFLogxK
U2 - 10.1117/12.2578564
DO - 10.1117/12.2578564
M3 - Conference contribution
AN - SCOPUS:85107447739
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Emerging Digital Micromirror Device Based Systems and Applications XIII
A2 - Ehmke, John
A2 - Lee, Benjamin L.
PB - SPIE
T2 - Emerging Digital Micromirror Device Based Systems and Applications XIII 2021
Y2 - 6 March 2021 through 11 March 2021
ER -