Details
Original language | English |
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Title of host publication | 17th International Zurich Symposium on Electromagnetic Compatibility, 2006 |
Pages | 553-556 |
Number of pages | 4 |
Publication status | Published - 2006 |
Event | 17th International Zurich Symposium on Electromagnetic Compatibility, 2006 - Singapur, Singapore Duration: 27 Feb 2006 → 3 Mar 2006 |
Publication series
Name | 17th International Zurich Symposium on Electromagnetic Compatibility, 2006 |
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Volume | 2006 |
Abstract
Most design engineers still believe that with a good shielded enclosure, well-shielded cables and high-performance ferrite sleeves, EMI compliance will be a straight forward task. This paper demonstartes experimentally that a poor PCB layout can cause electronic product to fail EMI specification badly even with all these fixes.
ASJC Scopus subject areas
- Engineering(all)
- General Engineering
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17th International Zurich Symposium on Electromagnetic Compatibility, 2006. 2006. p. 553-556 1629684 (17th International Zurich Symposium on Electromagnetic Compatibility, 2006; Vol. 2006).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Impact of PCB layout design on final product's EMI compliance
AU - See, Kye Yak
AU - Oswal, Manish
AU - Khan-Ngern, Werachet
AU - Canavero, Flavio
AU - Christopoulos, Christos
AU - Grabinski, Hartmut
PY - 2006
Y1 - 2006
N2 - Most design engineers still believe that with a good shielded enclosure, well-shielded cables and high-performance ferrite sleeves, EMI compliance will be a straight forward task. This paper demonstartes experimentally that a poor PCB layout can cause electronic product to fail EMI specification badly even with all these fixes.
AB - Most design engineers still believe that with a good shielded enclosure, well-shielded cables and high-performance ferrite sleeves, EMI compliance will be a straight forward task. This paper demonstartes experimentally that a poor PCB layout can cause electronic product to fail EMI specification badly even with all these fixes.
UR - http://www.scopus.com/inward/record.url?scp=33751070515&partnerID=8YFLogxK
U2 - 10.1109/EMCZUR.2006.214994
DO - 10.1109/EMCZUR.2006.214994
M3 - Conference contribution
AN - SCOPUS:33751070515
SN - 3952299049
SN - 9783952299043
T3 - 17th International Zurich Symposium on Electromagnetic Compatibility, 2006
SP - 553
EP - 556
BT - 17th International Zurich Symposium on Electromagnetic Compatibility, 2006
T2 - 17th International Zurich Symposium on Electromagnetic Compatibility, 2006
Y2 - 27 February 2006 through 3 March 2006
ER -