Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • M. Reuter
  • E. Gockenbach
  • H. Borsi
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Details

Original languageEnglish
Title of host publicationProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Pages339-342
Number of pages4
Volume1
Publication statusPublished - 2004
Event2004 IEEE International Conference on Solid Dielectrics ICSD 2004 - Toulouse, France
Duration: 5 Jul 20049 Jul 2004

Abstract

This contribution reports on experimental investigations dealing with the impact of different combined aging parameters like electrical field strength, conductor temperature, and test duration on the dielectric relaxation behaviour of full-sized model cables with cross-linked polyethylene insulation. The evaluation of time-domain isothermal depolarisation current measurements turns out that characteristic properties of a third order exponential decay function exhibit different trends depending on the nature of the various aging factors.

ASJC Scopus subject areas

Cite this

Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. / Reuter, M.; Gockenbach, E.; Borsi, H.
Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Vol. 1 2004. p. 339-342.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Reuter, M, Gockenbach, E & Borsi, H 2004, Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. in Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. vol. 1, pp. 339-342, 2004 IEEE International Conference on Solid Dielectrics ICSD 2004, Toulouse, France, 5 Jul 2004.
Reuter, M., Gockenbach, E., & Borsi, H. (2004). Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. In Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004 (Vol. 1, pp. 339-342)
Reuter M, Gockenbach E, Borsi H. Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. In Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Vol. 1. 2004. p. 339-342
Reuter, M. ; Gockenbach, E. ; Borsi, H. / Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation. Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Vol. 1 2004. pp. 339-342
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