Impact of different bonding methods on high voltage cable shield induced voltage and current in normal and fault conditions

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Mahdi Mahdipour
  • Asghar Akbari Azirani
  • Mohammad Khalilzadeh
  • Peter Werle

External Research Organisations

  • K.N. Toosi University of Technology
  • University of Tehran
View graph of relations

Details

Original languageEnglish
Title of host publication2017 25th Iranian Conference on Electrical Engineering, ICEE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1308-1312
Number of pages5
ISBN (electronic)9781509059638
Publication statusPublished - 19 Jul 2017
Event25th Iranian Conference on Electrical Engineering, ICEE 2017 - Tehran, Iran, Islamic Republic of
Duration: 2 May 20174 May 2017

Abstract

Six different bonding methods are discussed briefly. In order to find methods with least induced voltage and current, EMTP software is used to investigate the effect of these configurations on shield induced voltage and current. Normal and core to shield short circuit conditions, and surge over-voltage (lightning) are considered in simulations. Finally appropriate bonding methods for different conditions are proposed.

Keywords

    Bonding, Induced current, Induced voltage, Shield

ASJC Scopus subject areas

Cite this

Impact of different bonding methods on high voltage cable shield induced voltage and current in normal and fault conditions. / Mahdipour, Mahdi; Akbari Azirani, Asghar; Khalilzadeh, Mohammad et al.
2017 25th Iranian Conference on Electrical Engineering, ICEE 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 1308-1312 7985244.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Mahdipour, M, Akbari Azirani, A, Khalilzadeh, M & Werle, P 2017, Impact of different bonding methods on high voltage cable shield induced voltage and current in normal and fault conditions. in 2017 25th Iranian Conference on Electrical Engineering, ICEE 2017., 7985244, Institute of Electrical and Electronics Engineers Inc., pp. 1308-1312, 25th Iranian Conference on Electrical Engineering, ICEE 2017, Tehran, Iran, Islamic Republic of, 2 May 2017. https://doi.org/10.1109/IranianCEE.2017.7985244
Mahdipour, M., Akbari Azirani, A., Khalilzadeh, M., & Werle, P. (2017). Impact of different bonding methods on high voltage cable shield induced voltage and current in normal and fault conditions. In 2017 25th Iranian Conference on Electrical Engineering, ICEE 2017 (pp. 1308-1312). Article 7985244 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IranianCEE.2017.7985244
Mahdipour M, Akbari Azirani A, Khalilzadeh M, Werle P. Impact of different bonding methods on high voltage cable shield induced voltage and current in normal and fault conditions. In 2017 25th Iranian Conference on Electrical Engineering, ICEE 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 1308-1312. 7985244 doi: 10.1109/IranianCEE.2017.7985244
Mahdipour, Mahdi ; Akbari Azirani, Asghar ; Khalilzadeh, Mohammad et al. / Impact of different bonding methods on high voltage cable shield induced voltage and current in normal and fault conditions. 2017 25th Iranian Conference on Electrical Engineering, ICEE 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 1308-1312
Download
@inproceedings{cef55e107ce447d8ab5325073aaa0e02,
title = "Impact of different bonding methods on high voltage cable shield induced voltage and current in normal and fault conditions",
abstract = "Six different bonding methods are discussed briefly. In order to find methods with least induced voltage and current, EMTP software is used to investigate the effect of these configurations on shield induced voltage and current. Normal and core to shield short circuit conditions, and surge over-voltage (lightning) are considered in simulations. Finally appropriate bonding methods for different conditions are proposed.",
keywords = "Bonding, Induced current, Induced voltage, Shield",
author = "Mahdi Mahdipour and {Akbari Azirani}, Asghar and Mohammad Khalilzadeh and Peter Werle",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.; 25th Iranian Conference on Electrical Engineering, ICEE 2017 ; Conference date: 02-05-2017 Through 04-05-2017",
year = "2017",
month = jul,
day = "19",
doi = "10.1109/IranianCEE.2017.7985244",
language = "English",
pages = "1308--1312",
booktitle = "2017 25th Iranian Conference on Electrical Engineering, ICEE 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

Download

TY - GEN

T1 - Impact of different bonding methods on high voltage cable shield induced voltage and current in normal and fault conditions

AU - Mahdipour, Mahdi

AU - Akbari Azirani, Asghar

AU - Khalilzadeh, Mohammad

AU - Werle, Peter

N1 - Publisher Copyright: © 2017 IEEE. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 2017/7/19

Y1 - 2017/7/19

N2 - Six different bonding methods are discussed briefly. In order to find methods with least induced voltage and current, EMTP software is used to investigate the effect of these configurations on shield induced voltage and current. Normal and core to shield short circuit conditions, and surge over-voltage (lightning) are considered in simulations. Finally appropriate bonding methods for different conditions are proposed.

AB - Six different bonding methods are discussed briefly. In order to find methods with least induced voltage and current, EMTP software is used to investigate the effect of these configurations on shield induced voltage and current. Normal and core to shield short circuit conditions, and surge over-voltage (lightning) are considered in simulations. Finally appropriate bonding methods for different conditions are proposed.

KW - Bonding

KW - Induced current

KW - Induced voltage

KW - Shield

UR - http://www.scopus.com/inward/record.url?scp=85032786975&partnerID=8YFLogxK

U2 - 10.1109/IranianCEE.2017.7985244

DO - 10.1109/IranianCEE.2017.7985244

M3 - Conference contribution

AN - SCOPUS:85032786975

SP - 1308

EP - 1312

BT - 2017 25th Iranian Conference on Electrical Engineering, ICEE 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 25th Iranian Conference on Electrical Engineering, ICEE 2017

Y2 - 2 May 2017 through 4 May 2017

ER -

By the same author(s)