Identifying the location of recombination from voltage-dependent quantum efficiency measurements

Research output: Contribution to journalConference articleResearchpeer review

Authors

  • Byungsul Min
  • Christian Kruse
  • Carsten Schinke
  • Martin Wolf
  • Matthias Müller
  • Hendrik Sträter
  • Matthias Wagner
  • Karsten Bothe
  • Rolf Brendel

Research Organisations

External Research Organisations

  • Institute for Solar Energy Research (ISFH)
  • SolarWorld Innovations GmbH
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Details

Original languageEnglish
Pages (from-to)120-125
Number of pages6
JournalEnergy Procedia
Volume124
Publication statusPublished - 21 Sept 2017
Event7th International Conference on Silicon Photovoltaics, SiliconPV 2017 - Freiburg, Germany
Duration: 3 Apr 20175 Apr 2017

Abstract

This paper investigates process-induced variations of the open-circuit voltage (Voc) using voltage-dependent quantum efficiency measurements. By means of device modelling we show that this method is able to explain the Voc difference of two solar cells, even if they show identical electrical behaviour under short-circuit condition. This paper furthermore explains how the origin of Voc variations can be classified into emitter, base and rear of the solar cell. The simulation results have been experimentally verified with industrial-type passivated emitter and rear cells (PERC) cells made from p-type Czochralski wafers. The proposed analysis method is an attractive way for monitoring Voc variations of solar cells in industrial mass production since there is no need for specially prepared test structures.

Keywords

    open-circuit voltage, PERC, process monitoring, quantum efficiency

ASJC Scopus subject areas

Cite this

Identifying the location of recombination from voltage-dependent quantum efficiency measurements. / Min, Byungsul; Kruse, Christian; Schinke, Carsten et al.
In: Energy Procedia, Vol. 124, 21.09.2017, p. 120-125.

Research output: Contribution to journalConference articleResearchpeer review

Min, B, Kruse, C, Schinke, C, Wolf, M, Müller, M, Sträter, H, Wagner, M, Bothe, K & Brendel, R 2017, 'Identifying the location of recombination from voltage-dependent quantum efficiency measurements', Energy Procedia, vol. 124, pp. 120-125. https://doi.org/10.1016/j.egypro.2017.09.324
Min, B., Kruse, C., Schinke, C., Wolf, M., Müller, M., Sträter, H., Wagner, M., Bothe, K., & Brendel, R. (2017). Identifying the location of recombination from voltage-dependent quantum efficiency measurements. Energy Procedia, 124, 120-125. https://doi.org/10.1016/j.egypro.2017.09.324
Min B, Kruse C, Schinke C, Wolf M, Müller M, Sträter H et al. Identifying the location of recombination from voltage-dependent quantum efficiency measurements. Energy Procedia. 2017 Sept 21;124:120-125. doi: 10.1016/j.egypro.2017.09.324
Min, Byungsul ; Kruse, Christian ; Schinke, Carsten et al. / Identifying the location of recombination from voltage-dependent quantum efficiency measurements. In: Energy Procedia. 2017 ; Vol. 124. pp. 120-125.
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abstract = "This paper investigates process-induced variations of the open-circuit voltage (Voc) using voltage-dependent quantum efficiency measurements. By means of device modelling we show that this method is able to explain the Voc difference of two solar cells, even if they show identical electrical behaviour under short-circuit condition. This paper furthermore explains how the origin of Voc variations can be classified into emitter, base and rear of the solar cell. The simulation results have been experimentally verified with industrial-type passivated emitter and rear cells (PERC) cells made from p-type Czochralski wafers. The proposed analysis method is an attractive way for monitoring Voc variations of solar cells in industrial mass production since there is no need for specially prepared test structures.",
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AU - Min, Byungsul

AU - Kruse, Christian

AU - Schinke, Carsten

AU - Wolf, Martin

AU - Müller, Matthias

AU - Sträter, Hendrik

AU - Wagner, Matthias

AU - Bothe, Karsten

AU - Brendel, Rolf

N1 - Funding Information: The authors thank M. Vogt for a critical reading of the manuscript. This work was funded by the Federal Ministry for Economic Affairs and Energy (FKZ 0325777). Publisher Copyright: © 2017 The Authors. Published by Elsevier Ltd. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 2017/9/21

Y1 - 2017/9/21

N2 - This paper investigates process-induced variations of the open-circuit voltage (Voc) using voltage-dependent quantum efficiency measurements. By means of device modelling we show that this method is able to explain the Voc difference of two solar cells, even if they show identical electrical behaviour under short-circuit condition. This paper furthermore explains how the origin of Voc variations can be classified into emitter, base and rear of the solar cell. The simulation results have been experimentally verified with industrial-type passivated emitter and rear cells (PERC) cells made from p-type Czochralski wafers. The proposed analysis method is an attractive way for monitoring Voc variations of solar cells in industrial mass production since there is no need for specially prepared test structures.

AB - This paper investigates process-induced variations of the open-circuit voltage (Voc) using voltage-dependent quantum efficiency measurements. By means of device modelling we show that this method is able to explain the Voc difference of two solar cells, even if they show identical electrical behaviour under short-circuit condition. This paper furthermore explains how the origin of Voc variations can be classified into emitter, base and rear of the solar cell. The simulation results have been experimentally verified with industrial-type passivated emitter and rear cells (PERC) cells made from p-type Czochralski wafers. The proposed analysis method is an attractive way for monitoring Voc variations of solar cells in industrial mass production since there is no need for specially prepared test structures.

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