How to Reproducibly Measure the Unintended EM-Emission from Handheld Devices

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Heyno Garbe
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Details

Original languageEnglish
Title of host publication2015 IEEE 5th International Conference on Consumer Electronics - Berlin
Subtitle of host publicationICCE-Berlin
EditorsJose Maria Flores-Arias, Stefan Mozar, Dietmar Hepper, Milan Z. Bjelica, Hans L. Cycon
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages211-212
Number of pages2
ISBN (electronic)9781479987481
Publication statusPublished - 2015
Event5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015 - Berlin, Germany
Duration: 6 Sept 20159 Sept 2015
Conference number: 5

Abstract

First this paper will explain the need to reproducibly measure the unintended radiation from handheld battery powered devices. The established test sites like Open Area Test Sites (OATS) fulfil the reproducible requirement but they are to expensive and need a big space. It is shown that the standard farfield conditions can be found in a TEM waveguide. At last it will be demonstrated how to get the same measurement results from a TEM-cell measurements as from an OATS.

Keywords

    emission measurement, Farfield, GTEM-cell, IEC61000-4-20, TEM-wave

ASJC Scopus subject areas

Cite this

How to Reproducibly Measure the Unintended EM-Emission from Handheld Devices. / Garbe, Heyno.
2015 IEEE 5th International Conference on Consumer Electronics - Berlin: ICCE-Berlin. ed. / Jose Maria Flores-Arias; Stefan Mozar; Dietmar Hepper; Milan Z. Bjelica; Hans L. Cycon. Institute of Electrical and Electronics Engineers Inc., 2015. p. 211-212 7391237.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Garbe, H 2015, How to Reproducibly Measure the Unintended EM-Emission from Handheld Devices. in JM Flores-Arias, S Mozar, D Hepper, MZ Bjelica & HL Cycon (eds), 2015 IEEE 5th International Conference on Consumer Electronics - Berlin: ICCE-Berlin., 7391237, Institute of Electrical and Electronics Engineers Inc., pp. 211-212, 5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015, Berlin, Germany, 6 Sept 2015. https://doi.org/10.1109/ICCE-Berlin.2015.7391237
Garbe, H. (2015). How to Reproducibly Measure the Unintended EM-Emission from Handheld Devices. In J. M. Flores-Arias, S. Mozar, D. Hepper, M. Z. Bjelica, & H. L. Cycon (Eds.), 2015 IEEE 5th International Conference on Consumer Electronics - Berlin: ICCE-Berlin (pp. 211-212). Article 7391237 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE-Berlin.2015.7391237
Garbe H. How to Reproducibly Measure the Unintended EM-Emission from Handheld Devices. In Flores-Arias JM, Mozar S, Hepper D, Bjelica MZ, Cycon HL, editors, 2015 IEEE 5th International Conference on Consumer Electronics - Berlin: ICCE-Berlin. Institute of Electrical and Electronics Engineers Inc. 2015. p. 211-212. 7391237 doi: 10.1109/ICCE-Berlin.2015.7391237
Garbe, Heyno. / How to Reproducibly Measure the Unintended EM-Emission from Handheld Devices. 2015 IEEE 5th International Conference on Consumer Electronics - Berlin: ICCE-Berlin. editor / Jose Maria Flores-Arias ; Stefan Mozar ; Dietmar Hepper ; Milan Z. Bjelica ; Hans L. Cycon. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 211-212
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@inproceedings{aa9292ebc7f64eb3978f66936754c9e7,
title = "How to Reproducibly Measure the Unintended EM-Emission from Handheld Devices",
abstract = "First this paper will explain the need to reproducibly measure the unintended radiation from handheld battery powered devices. The established test sites like Open Area Test Sites (OATS) fulfil the reproducible requirement but they are to expensive and need a big space. It is shown that the standard farfield conditions can be found in a TEM waveguide. At last it will be demonstrated how to get the same measurement results from a TEM-cell measurements as from an OATS.",
keywords = "emission measurement, Farfield, GTEM-cell, IEC61000-4-20, TEM-wave",
author = "Heyno Garbe",
year = "2015",
doi = "10.1109/ICCE-Berlin.2015.7391237",
language = "English",
pages = "211--212",
editor = "Flores-Arias, {Jose Maria} and Stefan Mozar and Dietmar Hepper and Bjelica, {Milan Z.} and Cycon, {Hans L.}",
booktitle = "2015 IEEE 5th International Conference on Consumer Electronics - Berlin",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015 ; Conference date: 06-09-2015 Through 09-09-2015",

}

Download

TY - GEN

T1 - How to Reproducibly Measure the Unintended EM-Emission from Handheld Devices

AU - Garbe, Heyno

N1 - Conference code: 5

PY - 2015

Y1 - 2015

N2 - First this paper will explain the need to reproducibly measure the unintended radiation from handheld battery powered devices. The established test sites like Open Area Test Sites (OATS) fulfil the reproducible requirement but they are to expensive and need a big space. It is shown that the standard farfield conditions can be found in a TEM waveguide. At last it will be demonstrated how to get the same measurement results from a TEM-cell measurements as from an OATS.

AB - First this paper will explain the need to reproducibly measure the unintended radiation from handheld battery powered devices. The established test sites like Open Area Test Sites (OATS) fulfil the reproducible requirement but they are to expensive and need a big space. It is shown that the standard farfield conditions can be found in a TEM waveguide. At last it will be demonstrated how to get the same measurement results from a TEM-cell measurements as from an OATS.

KW - emission measurement

KW - Farfield

KW - GTEM-cell

KW - IEC61000-4-20

KW - TEM-wave

UR - http://www.scopus.com/inward/record.url?scp=84977640422&partnerID=8YFLogxK

U2 - 10.1109/ICCE-Berlin.2015.7391237

DO - 10.1109/ICCE-Berlin.2015.7391237

M3 - Conference contribution

AN - SCOPUS:84977640422

SP - 211

EP - 212

BT - 2015 IEEE 5th International Conference on Consumer Electronics - Berlin

A2 - Flores-Arias, Jose Maria

A2 - Mozar, Stefan

A2 - Hepper, Dietmar

A2 - Bjelica, Milan Z.

A2 - Cycon, Hans L.

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015

Y2 - 6 September 2015 through 9 September 2015

ER -