High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Uwe Arz
  • Dylan F. Williams
  • David K. Walker
  • Hartmut Grabinski

External Research Organisations

  • National Institute of Standards and Technology (NIST)
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Details

Original languageEnglish
Title of host publication56th ARFTG Conference Digest
Subtitle of host publicationMetrology and Test for RF Telecommunications, ARFTG 2000
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (electronic)0780356861, 9780780356863
Publication statusPublished - 2000
Event56th ARFTG Conference Digest, ARFTG 2000 - Boulder, United States
Duration: 30 Nov 20001 Dec 2000

Publication series

Name56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000

Abstract

In this paper we apply a broadband measurement method to determine the propagation characteristics of coupled-line structures fabricated in different metallization layers of a 0.25 μm CMOS technology. We show that the matrices of frequency-dependent line parameters, as extracted from calibrated four-port S-parameter measurements, agree well with data predicted by numerical calculations, and discuss the impact of metal level height above the substrate on the transmission characteristics.

ASJC Scopus subject areas

Cite this

High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers. / Arz, Uwe; Williams, Dylan F.; Walker, David K. et al.
56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000. Institute of Electrical and Electronics Engineers Inc., 2000. 4120124 (56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Arz, U, Williams, DF, Walker, DK & Grabinski, H 2000, High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers. in 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000., 4120124, 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000, Institute of Electrical and Electronics Engineers Inc., 56th ARFTG Conference Digest, ARFTG 2000, Boulder, United States, 30 Nov 2000. https://doi.org/10.1109/ARFTG.2000.327425
Arz, U., Williams, D. F., Walker, D. K., & Grabinski, H. (2000). High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers. In 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000 Article 4120124 (56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ARFTG.2000.327425
Arz U, Williams DF, Walker DK, Grabinski H. High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers. In 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000. Institute of Electrical and Electronics Engineers Inc. 2000. 4120124. (56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000). doi: 10.1109/ARFTG.2000.327425
Arz, Uwe ; Williams, Dylan F. ; Walker, David K. et al. / High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers. 56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000. Institute of Electrical and Electronics Engineers Inc., 2000. (56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000).
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