Details
| Original language | English |
|---|---|
| Article number | 153002 |
| Journal | Physical review letters |
| Volume | 102 |
| Issue number | 15 |
| Publication status | Published - 16 Apr 2009 |
| Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy(all)
- General Physics and Astronomy
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High-fidelity transport of trapped-ion qubits through an X-junction trap array. / Blakestad, R. B.; Ospelkaus, C.; Vandevender, A. P. et al.
In: Physical review letters, Vol. 102, No. 15, 153002, 16.04.2009.
In: Physical review letters, Vol. 102, No. 15, 153002, 16.04.2009.
Research output: Contribution to journal › Article › Research › peer review
Blakestad, RB, Ospelkaus, C, Vandevender, AP, Amini, JM, Britton, J, Leibfried, D & Wineland, DJ 2009, 'High-fidelity transport of trapped-ion qubits through an X-junction trap array', Physical review letters, vol. 102, no. 15, 153002. https://doi.org/10.1103/PhysRevLett.102.153002
Blakestad, R. B., Ospelkaus, C., Vandevender, A. P., Amini, J. M., Britton, J., Leibfried, D., & Wineland, D. J. (2009). High-fidelity transport of trapped-ion qubits through an X-junction trap array. Physical review letters, 102(15), Article 153002. https://doi.org/10.1103/PhysRevLett.102.153002
Blakestad RB, Ospelkaus C, Vandevender AP, Amini JM, Britton J, Leibfried D et al. High-fidelity transport of trapped-ion qubits through an X-junction trap array. Physical review letters. 2009 Apr 16;102(15):153002. doi: 10.1103/PhysRevLett.102.153002
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AU - Blakestad, R. B.
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AU - Leibfried, D.
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