Higher order mode behavior in loaded and unloaded TEM cells

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Ch Groh
  • H. Garbe
  • M. Koch

External Research Organisations

  • Autoflug GmbH
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Details

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages225-230
Number of pages6
ISBN (electronic)078035057X, 9780780350571
Publication statusPublished - 1999
Event1999 IEEE International Symposium on Electromagnetic Compatibility, EMC 1999 - Seattle, United States
Duration: 2 Aug 19996 Aug 1999

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume1
ISSN (Print)1077-4076
ISSN (electronic)2158-1118

Abstract

The resonances of higher order modes determine the usable bandwidth of a TEM cell. Since the resonating mode and its characteristic field distribution are known, measures are taken to selectively suppress resonances of higher order modes. Thus the bandwidth of the cell is expanded without affecting the TEM mode. Loading the cell with objects results in abrupt changes of the cross sectional geometry. The effects on the resonances due to the size and position of the objects are examined.

ASJC Scopus subject areas

Cite this

Higher order mode behavior in loaded and unloaded TEM cells. / Groh, Ch; Garbe, H.; Koch, M.
IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., 1999. p. 225-230 812899 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 1).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Groh, C, Garbe, H & Koch, M 1999, Higher order mode behavior in loaded and unloaded TEM cells. in IEEE International Symposium on Electromagnetic Compatibility., 812899, IEEE International Symposium on Electromagnetic Compatibility, vol. 1, Institute of Electrical and Electronics Engineers Inc., pp. 225-230, 1999 IEEE International Symposium on Electromagnetic Compatibility, EMC 1999, Seattle, United States, 2 Aug 1999. https://doi.org/10.1109/ISEMC.1999.812899
Groh, C., Garbe, H., & Koch, M. (1999). Higher order mode behavior in loaded and unloaded TEM cells. In IEEE International Symposium on Electromagnetic Compatibility (pp. 225-230). Article 812899 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.1999.812899
Groh C, Garbe H, Koch M. Higher order mode behavior in loaded and unloaded TEM cells. In IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc. 1999. p. 225-230. 812899. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/ISEMC.1999.812899
Groh, Ch ; Garbe, H. ; Koch, M. / Higher order mode behavior in loaded and unloaded TEM cells. IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., 1999. pp. 225-230 (IEEE International Symposium on Electromagnetic Compatibility).
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