Details
| Original language | English |
|---|---|
| Title of host publication | 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 |
| Pages | 2389-2394 |
| Number of pages | 6 |
| ISBN (electronic) | 9781424429509 |
| Publication status | Published - 2009 |
| Externally published | Yes |
| Event | 34th IEEE Photovoltaic Specialists Conference (PVSC 2009) - Philadelphia, PA, United States Duration: 7 Jun 2009 → 12 Jun 2009 Conference number: 34 |
Publication series
| Name | Conference Record of the IEEE Photovoltaic Specialists Conference |
|---|---|
| ISSN (Print) | 0160-8371 |
Abstract
Fast laser processing is commonly done using a Gaussian laser beam in combination with a scanner. Single laser pulses only affect a limited area beneath the Gaussian intensity bell and result in circular impact regions. Adjacent impact regions have to overlap when continuous processing larger areas. Thus, the processing speed is greatly enhanced by replacing the Gaussian profile with a flat-top intensity profile and by replacing the radial symmetric cross section with a rectangular cross section. However, processing with a rectangular flat-top laser beam through a scanner has, to the best of our knowledge, not yet been demonstrated. We report on the successful design and experimental tests of a new laser system that images a rectangular flat-top profile through a scanner. Our so-called Simultaneous Scanning and Laser Beam Imaging - system (SIMSALABIM) machines a finger pattern that covers 50 % of a (125 x 125) mm2 crystalline Si solar cell in 14 s. Two parallel systems with increased output power should process the same area in just 2.5 s.
ASJC Scopus subject areas
- Engineering(all)
- Control and Systems Engineering
- Engineering(all)
- Industrial and Manufacturing Engineering
- Engineering(all)
- Electrical and Electronic Engineering
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2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009. 2009. p. 2389-2394 5411310 (Conference Record of the IEEE Photovoltaic Specialists Conference).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - High speed laser structuring of crystalline silicon solar cells
AU - Eidelloth, S.
AU - Neubert, T.
AU - Brendemühl, T.
AU - Hermann, S.
AU - Giesel, P.
AU - Brendel, R.
N1 - Conference code: 34
PY - 2009
Y1 - 2009
N2 - Fast laser processing is commonly done using a Gaussian laser beam in combination with a scanner. Single laser pulses only affect a limited area beneath the Gaussian intensity bell and result in circular impact regions. Adjacent impact regions have to overlap when continuous processing larger areas. Thus, the processing speed is greatly enhanced by replacing the Gaussian profile with a flat-top intensity profile and by replacing the radial symmetric cross section with a rectangular cross section. However, processing with a rectangular flat-top laser beam through a scanner has, to the best of our knowledge, not yet been demonstrated. We report on the successful design and experimental tests of a new laser system that images a rectangular flat-top profile through a scanner. Our so-called Simultaneous Scanning and Laser Beam Imaging - system (SIMSALABIM) machines a finger pattern that covers 50 % of a (125 x 125) mm2 crystalline Si solar cell in 14 s. Two parallel systems with increased output power should process the same area in just 2.5 s.
AB - Fast laser processing is commonly done using a Gaussian laser beam in combination with a scanner. Single laser pulses only affect a limited area beneath the Gaussian intensity bell and result in circular impact regions. Adjacent impact regions have to overlap when continuous processing larger areas. Thus, the processing speed is greatly enhanced by replacing the Gaussian profile with a flat-top intensity profile and by replacing the radial symmetric cross section with a rectangular cross section. However, processing with a rectangular flat-top laser beam through a scanner has, to the best of our knowledge, not yet been demonstrated. We report on the successful design and experimental tests of a new laser system that images a rectangular flat-top profile through a scanner. Our so-called Simultaneous Scanning and Laser Beam Imaging - system (SIMSALABIM) machines a finger pattern that covers 50 % of a (125 x 125) mm2 crystalline Si solar cell in 14 s. Two parallel systems with increased output power should process the same area in just 2.5 s.
UR - http://www.scopus.com/inward/record.url?scp=77951555022&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2009.5411310
DO - 10.1109/PVSC.2009.5411310
M3 - Conference contribution
AN - SCOPUS:77951555022
SN - 978-1-4244-2949-3
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 2389
EP - 2394
BT - 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
T2 - 34th IEEE Photovoltaic Specialists Conference (PVSC 2009)
Y2 - 7 June 2009 through 12 June 2009
ER -