Details
| Original language | English |
|---|---|
| Title of host publication | Advances in Optical Thin Films II |
| Subtitle of host publication | 13 - 15 September 2005, Jena, Germany |
| Place of Publication | Bellingham |
| Publisher | SPIE |
| ISBN (print) | 0-8194-5981-X |
| Publication status | Published - 5 Oct 2005 |
| Externally published | Yes |
| Event | Advances in Optical Thin Films II - Jena, Germany Duration: 13 Sept 2005 → 15 Sept 2005 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Publisher | SPIE |
| Volume | 5963 |
| ISSN (Print) | 0277-786X |
Abstract
Past investigations in the damage threshold of laser components have been of high interest within optics characterization. In view of the ever increasing complexity of optical components investigations in the LIDT require a more sophisticated adaptation of the measurement set-ups. The optimization of high power solid state laser systems led to the disc laser concept, which provides an increased output power. The achievable output power is mainly limited by the damage threshold of the coated and bonded crystal. Consequently, the understanding of damage mechanisms is a fundamental requirement for the disc laser optimization. It is assumed that the damage in disc laser crystals and deposited coatings can be traced back to the defects on the crystal surface or in the optical coatings. The expected size of the defects initiating laser damage ranges in the micrometer scale. In the present study, LIDT experiments are focused on the verification of this assumption and are intended to assist in the optimization of the manufacturing process. For a detection of the defects, an online defect inspection system was extended by a highly resolving imaging technique. The LIDT measurements have been performed on the basis of the Son1 protocol according to ISO 11254-2 at an effective pulse duration of about 11ns and a repetition rate of a few Hz at the wavelength 1.064nm.
Keywords
- Damage morphology, Defect inspection, Disc laser, Inclusion induced damage, ISO11254-2
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
Advances in Optical Thin Films II: 13 - 15 September 2005, Jena, Germany. Bellingham: SPIE, 2005. (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 5963).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - High resolution video based inspection method for LIDT investigations of thin disc laser crystals
AU - Jupé, Marco
AU - Starke, Kai
AU - Jensen, Lars
AU - Mädebach, Heinrich
AU - Ristau, Detlev
PY - 2005/10/5
Y1 - 2005/10/5
N2 - Past investigations in the damage threshold of laser components have been of high interest within optics characterization. In view of the ever increasing complexity of optical components investigations in the LIDT require a more sophisticated adaptation of the measurement set-ups. The optimization of high power solid state laser systems led to the disc laser concept, which provides an increased output power. The achievable output power is mainly limited by the damage threshold of the coated and bonded crystal. Consequently, the understanding of damage mechanisms is a fundamental requirement for the disc laser optimization. It is assumed that the damage in disc laser crystals and deposited coatings can be traced back to the defects on the crystal surface or in the optical coatings. The expected size of the defects initiating laser damage ranges in the micrometer scale. In the present study, LIDT experiments are focused on the verification of this assumption and are intended to assist in the optimization of the manufacturing process. For a detection of the defects, an online defect inspection system was extended by a highly resolving imaging technique. The LIDT measurements have been performed on the basis of the Son1 protocol according to ISO 11254-2 at an effective pulse duration of about 11ns and a repetition rate of a few Hz at the wavelength 1.064nm.
AB - Past investigations in the damage threshold of laser components have been of high interest within optics characterization. In view of the ever increasing complexity of optical components investigations in the LIDT require a more sophisticated adaptation of the measurement set-ups. The optimization of high power solid state laser systems led to the disc laser concept, which provides an increased output power. The achievable output power is mainly limited by the damage threshold of the coated and bonded crystal. Consequently, the understanding of damage mechanisms is a fundamental requirement for the disc laser optimization. It is assumed that the damage in disc laser crystals and deposited coatings can be traced back to the defects on the crystal surface or in the optical coatings. The expected size of the defects initiating laser damage ranges in the micrometer scale. In the present study, LIDT experiments are focused on the verification of this assumption and are intended to assist in the optimization of the manufacturing process. For a detection of the defects, an online defect inspection system was extended by a highly resolving imaging technique. The LIDT measurements have been performed on the basis of the Son1 protocol according to ISO 11254-2 at an effective pulse duration of about 11ns and a repetition rate of a few Hz at the wavelength 1.064nm.
KW - Damage morphology
KW - Defect inspection
KW - Disc laser
KW - Inclusion induced damage
KW - ISO11254-2
UR - http://www.scopus.com/inward/record.url?scp=33144457492&partnerID=8YFLogxK
U2 - 10.1117/12.625204
DO - 10.1117/12.625204
M3 - Conference contribution
AN - SCOPUS:33144457492
SN - 0-8194-5981-X
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Advances in Optical Thin Films II
PB - SPIE
CY - Bellingham
T2 - Advances in Optical Thin Films II
Y2 - 13 September 2005 through 15 September 2005
ER -