High frequency conductance of a quantum point contact

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  • Ruhr-Universität Bochum
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Original languageEnglish
Pages (from-to)272-275
Number of pages4
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Volume22
Issue number1-3
Publication statusPublished - 7 Feb 2004
Event15th International Conference on ELectronic Propreties - Nara, Japan
Duration: 14 Jul 200318 Jul 2003

Abstract

We present an experimental study of the AC conductance GAC of an atomic force microscope engraved quantum point contact at high frequency f=160 MHz. In agreement with theoretical predictions the real part R(GAC) is unchanged from the DC-conductance GDC. The imaginary part I(G AC) changes for every addition of a new conductance channel.

Keywords

    AFM lithography, High frequency conductance, Quantum point contact

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Cite this

High frequency conductance of a quantum point contact. / Regul, J.; Hohls, F.; Reuter, D. et al.
In: Physica E: Low-Dimensional Systems and Nanostructures, Vol. 22, No. 1-3, 07.02.2004, p. 272-275.

Research output: Contribution to journalConference articleResearchpeer review

Regul J, Hohls F, Reuter D, Wieck AD, Haug RJ. High frequency conductance of a quantum point contact. Physica E: Low-Dimensional Systems and Nanostructures. 2004 Feb 7;22(1-3):272-275. doi: 10.1016/j.physe.2003.11.266
Regul, J. ; Hohls, F. ; Reuter, D. et al. / High frequency conductance of a quantum point contact. In: Physica E: Low-Dimensional Systems and Nanostructures. 2004 ; Vol. 22, No. 1-3. pp. 272-275.
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note = "Funding information: We thank Ulrich Keyser for the AFM lithography and the AFM picture and we acknowledge financial support by the BMBF and the DFG.; 15th International Conference on ELectronic Propreties ; Conference date: 14-07-2003 Through 18-07-2003",
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T1 - High frequency conductance of a quantum point contact

AU - Regul, J.

AU - Hohls, F.

AU - Reuter, D.

AU - Wieck, A. D.

AU - Haug, R. J.

N1 - Funding information: We thank Ulrich Keyser for the AFM lithography and the AFM picture and we acknowledge financial support by the BMBF and the DFG.

PY - 2004/2/7

Y1 - 2004/2/7

N2 - We present an experimental study of the AC conductance GAC of an atomic force microscope engraved quantum point contact at high frequency f=160 MHz. In agreement with theoretical predictions the real part R(GAC) is unchanged from the DC-conductance GDC. The imaginary part I(G AC) changes for every addition of a new conductance channel.

AB - We present an experimental study of the AC conductance GAC of an atomic force microscope engraved quantum point contact at high frequency f=160 MHz. In agreement with theoretical predictions the real part R(GAC) is unchanged from the DC-conductance GDC. The imaginary part I(G AC) changes for every addition of a new conductance channel.

KW - AFM lithography

KW - High frequency conductance

KW - Quantum point contact

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DO - 10.1016/j.physe.2003.11.266

M3 - Conference article

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EP - 275

JO - Physica E: Low-Dimensional Systems and Nanostructures

JF - Physica E: Low-Dimensional Systems and Nanostructures

SN - 1386-9477

IS - 1-3

T2 - 15th International Conference on ELectronic Propreties

Y2 - 14 July 2003 through 18 July 2003

ER -

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